scholarly journals Monotonic Normalized Heat Diffusion for Regular Bipartite Graphs with Four Eigenvalues

2021 ◽  
Vol 38 (1) ◽  
Author(s):  
Tasuku Kubo ◽  
Ryuya Namba
Keyword(s):  
Bipartite Graphs ◽  
Heat Diffusion

Bipartite Graphs and their Applications

1998 ◽  
Author(s):  
Armen S. Asratian ◽  
Tristan M. J. Denley ◽  
Roland Häggkvist
Keyword(s):  
Bipartite Graphs

Heat Diffusion in an Optical Logic Gate Array on Silicon-on-Sapphire

1997 ◽  
Vol 7 (3) ◽  
pp. 739-748
Author(s):  
H. Gualous ◽  
A. Koster ◽  
D. Pascal ◽  
S. Laval
Keyword(s):  
Logic Gate ◽  
Heat Diffusion ◽  
Optical Logic ◽  
Optical Logic Gate ◽  
Gate Array

\Transient Heat Diffusion Problems with Variable Thermal Properties Solved by Generalized Integral Transform Technique

2014 ◽  
Vol 8 (5) ◽  
pp. 931
Author(s):  
Marcelo Ferreira Pelegrini ◽  
Thiago Antonini Alves ◽  
Ricardo Alan Verdú Ramos ◽  
Cassio Roberto Macedo Maia
Keyword(s):  
Thermal Properties ◽  
Integral Transform ◽  
Heat Diffusion ◽  
Transient Heat Diffusion ◽  
Integral Transform Technique ◽  
Diffusion Problems

Fault Localization and Functional Testing of ICs by Lock-in Thermography

2002 ◽  
Author(s):  
O. Breitenstein ◽  
J.P. Rakotoniaina ◽  
F. Altmann ◽  
J. Schulz ◽  
G. Linse
Keyword(s):  
Spatial Resolution ◽  
Electronic Device ◽  
Imaging Techniques ◽  
Heat Diffusion ◽  
Acquisition Time ◽  
Temperature Modulation ◽  
Heat Sources ◽  
Ir Camera ◽  
Free Running ◽  
Lock In

Abstract In this paper new thermographic techniques with significant improved temperature and/or spatial resolution are presented and compared with existing techniques. In infrared (IR) lock-in thermography heat sources in an electronic device are periodically activated electrically, and the surface is imaged by a free-running IR camera. By computer processing and averaging the images over a certain acquisition time, a surface temperature modulation below 100 µK can be resolved. Moreover, the effective spatial resolution is considerably improved compared to stead-state thermal imaging techniques, since the lateral heat diffusion is suppressed in this a.c. technique. However, a serious limitation is that the spatial resolution is limited to about 5 microns due to the IR wavelength range of 3 -5 µm used by the IR camera. Nevertheless, we demonstrate that lock-in thermography reliably allows the detection of defects in ICs if their power exceeds some 10 µW. The imaging can be performed also through the silicon substrate from the backside of the chip. Also the well-known fluorescent microthermal imaging (FMI) technique can be be used in lock-in mode, leading to a temperature resolution in the mK range, but a spatial resolution below 1 micron.

Hurricane in Bipartite Graphs: The Lethal Nodes of Butterflies

2020 ◽  
Author(s):  
Qiuyu Zhu ◽  
Jiahong Zheng ◽  
Hao Yang ◽  
Chen Chen ◽  
Xiaoyang Wang ◽  
...  
Keyword(s):  
Bipartite Graphs
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