Wafer map defect pattern classification based on convolutional neural network features and error-correcting output codes
2020 ◽
Vol 31
(8)
◽
pp. 1861-1875
◽
2018 ◽
Vol 31
(2)
◽
pp. 309-314
◽
Keyword(s):
Lung Pattern Classification for Interstitial Lung Diseases Using a Deep Convolutional Neural Network
2016 ◽
Vol 35
(5)
◽
pp. 1207-1216
◽
2018 ◽
Vol 2018.29
(0)
◽
pp. 2C11
◽
2019 ◽
Vol 13
(6)
◽
pp. 1225-1232
◽
Keyword(s):
2020 ◽
Vol 58
(4)
◽
pp. 725-737
◽