Decreased degradation of poly(p-phenylene vinylene) films at the indium–tin oxide interface

2010 ◽  
Vol 46 (8) ◽  
pp. 2644-2648 ◽  
Author(s):  
L. C. Poças ◽  
S. L. Nogueira ◽  
R. S. Nobuyasu ◽  
Gustavo G. Dalkiranis ◽  
M. J. M. Pires ◽  
...  
Keyword(s):  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Phenylene Vinylene ◽  
Oxide Interface

scholarly journals Influence of Molecular Aggregation on Electron Transfer at the Perylene Diimide/Indium-Tin Oxide Interface

2016 ◽  
Vol 8 (49) ◽  
pp. 34089-34097 ◽  
Author(s):  
Yilong Zheng ◽  
Fadi M. Jradi ◽  
Timothy C. Parker ◽  
Stephen Barlow ◽  
Seth R. Marder ◽  
...  
Keyword(s):  
Electron Transfer ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Perylene Diimide ◽  
Molecular Aggregation ◽  
Oxide Interface

Light-soaking issue in polymer solar cells: Photoinduced energy level alignment at the sol-gel processed metal oxide and indium tin oxide interface

2012 ◽  
Vol 111 (11) ◽  
pp. 114511 ◽  
Author(s):  
Junghwan Kim ◽  
Geunjin Kim ◽  
Youna Choi ◽  
Jongjin Lee ◽  
Sung Heum Park ◽  
...  
Keyword(s):  
Solar Cells ◽  
Energy Level ◽  
Metal Oxide ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Polymer Solar Cells ◽  
Sol Gel ◽  
Oxide Interface ◽  
Energy Level Alignment

Energy level alignment and hole injection property of poly(9-vinylcarbazole)/indium tin oxide interface

2018 ◽  
Vol 706 ◽  
pp. 317-322 ◽  
Author(s):  
Junkyeong Jeong ◽  
Jiyeon Lee ◽  
Hyunchan Lee ◽  
Gyeongho Hyun ◽  
Soohyung Park ◽  
...  
Keyword(s):  
Energy Level ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Hole Injection ◽  
Oxide Interface ◽  
Energy Level Alignment ◽  
Injection Property

Space-Charge-Limited Charge Injection From Ito/Ppv Into A Trap-Free Molecularly Doped Polymer

1993 ◽  
Vol 328 ◽  
Author(s):  
H. Antoniadis ◽  
M. Abkowitz ◽  
B. R. Hsieh ◽  
S. A. Jenekhe ◽  
M. Stolka
Keyword(s):  
Space Charge ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Dark Current ◽  
Phenylene Vinylene ◽  
Electroluminescent Devices ◽  
Hole Transporting ◽  
Novel Method ◽  
Doped Polymer ◽  
Space Charge Limited

ABSTRACTWe describe bilayer structures comprised of a poly (p-phenylene vinylene) (PPV) layer and a trap-free diaryldiamine (TPD) doped in polycarbonate (PC) layer, sandwiched between indium-tin-oxide (ITO) and aluminum (Al) contacts. Two critical phenomena in the operation of polymer based electroluminescent devices, interface injection and carrier range, are investigated. It is established that the ITO/PPV contact is capable of sustaining dark current under trap-free space-charge-limited (TFSCL) conditions into a hole transporting TPD:PC layer. TFSCL currents are not observed in devices without the PPV layer. Upon increasing the thickness of the PPV layer a deviation from the TFSCL regime is observed which is attributed to trapping of the injected holes within PPV. These observations suggest a novel method for estimating the trapping Mobility-lifetime product μτ for holes in PPV. By this means we estimate μτ ∼ 10−9 cm2/V.

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