In situ X-ray photoelectron spectroscopy study: effect of inert Ar sputter etching on the core-level spectra of the CVD-grown tri-layer MoS2 thin films

Journal of Materials Science Materials in Electronics ◽

10.1007/s10854-021-06798-2 ◽

2021 ◽

Author(s):

V. Jayaseelan ◽

R. K. Kalaiezhily ◽

Nitin Babu Shinde ◽

K. Kamala Bharathi ◽

M. Navaneethan ◽

...

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

Core Level ◽

Spectroscopy Study ◽

X Ray ◽

The Core ◽

Sputter Etching

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Structure of reactively sputter deposited tin-nitride thin films: A combined X-ray photoelectron spectroscopy, in situ X-ray reflectivity and X-ray absorption spectroscopy study

Thin Solid Films ◽

10.1016/j.tsf.2005.07.034 ◽

2005 ◽

Vol 493 (1-2) ◽

pp. 67-76 ◽

Cited By ~ 37

Author(s):

Dirk Lützenkirchen-Hecht ◽

Ronald Frahm

Keyword(s):

Thin Films ◽

Absorption Spectroscopy ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

X Ray ◽

Sputter Deposited ◽

Tin Nitride ◽

X Ray Absorption

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Ion versus neutral irradiation of thin films of amorphous SiO2: an in situ X-ray photoelectron spectroscopy study

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(96)00069-9 ◽

1996 ◽

Vol 116 (1-4) ◽

pp. 342-346 ◽

Cited By ~ 4

Author(s):

Alberto Torrisi ◽

Antonino Licciardello ◽

Valentina Ancarani ◽

Massimiliano Cantiano ◽

Orazio Puglisi

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

Amorphous Sio2 ◽

X Ray

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In situ Hard X-ray Photoelectron Spectroscopy on the Origin of Irreversibility in Electrochromic LixWO3 Thin Films

Applied Surface Science ◽

10.1016/j.apsusc.2021.150898 ◽

2021 ◽

pp. 150898

Author(s):

Makoto Takayanagi ◽

Takashi Tsuchiya ◽

Shigenori Ueda ◽

Tohru Higuchi ◽

Kazuya Terabe

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

X Ray

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A transmission electron microscopy and X-ray photoelectron spectroscopy study of annealing induced γ-phase nucleation, clustering, and interfacial dynamics in reactively sputtered amorphous alumina thin films

Journal of Applied Physics ◽

10.1063/1.4916331 ◽

2015 ◽

Vol 117 (12) ◽

pp. 125307 ◽

Cited By ~ 11

Author(s):

A. K. Nanda Kumar ◽

S. Prasanna ◽

B. Subramanian ◽

S. Jayakumar ◽

G. Mohan Rao

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

Transmission Electron Microscopy ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

Interfacial Dynamics ◽

X Ray ◽

Transmission Electron ◽

Phase Nucleation ◽

Amorphous Alumina

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X-ray photoelectron spectroscopy study of Sn+ implanted a-Si1 − xCx:H thin films

Materials Science and Engineering B ◽

10.1016/0921-5107(94)04038-6 ◽

1995 ◽

Vol 29 (1-3) ◽

pp. 165-169 ◽

Cited By ~ 3

Author(s):

N. Tzenov ◽

D. Dimova-Malinovska ◽

Ts. Marinova ◽

V. Krastev ◽

T. Tsvetkova

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

X Ray

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An X-ray photoelectron spectroscopy study of the hydration of C2S thin films

Cement and Concrete Research ◽

10.1016/j.cemconres.2014.03.005 ◽

2014 ◽

Vol 60 ◽

pp. 83-90 ◽

Cited By ~ 11

Author(s):

Vanessa Rheinheimer ◽

Ignasi Casanova

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

X Ray

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Behavior of oxygen doped SiC thin films: An x-ray photoelectron spectroscopy study

Journal of Applied Physics ◽

10.1063/1.1332796 ◽

2001 ◽

Vol 89 (1) ◽

pp. 212-216 ◽

Cited By ~ 96

Author(s):

A. Avila ◽

I. Montero ◽

L. Galán ◽

J. M. Ripalda ◽

R. Levy

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

X Ray

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An in situ near-ambient pressure X-ray Photoelectron Spectroscopy study of Mn polarised anodically in a cell with solid oxide electrolyte

Electrochimica Acta ◽

10.1016/j.electacta.2015.05.173 ◽

2015 ◽

Vol 174 ◽

pp. 532-541 ◽

Cited By ~ 11

Author(s):

Benedetto Bozzini ◽

Matteo Amati ◽

Patrizia Bocchetta ◽

Simone Dal Zilio ◽

Axel Knop-Gericke ◽

...

Keyword(s):

Photoelectron Spectroscopy ◽

Ambient Pressure ◽

Solid Oxide ◽

Spectroscopy Study ◽

Solid Oxide Electrolyte ◽

X Ray ◽

A Cell ◽

Oxide Electrolyte

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X-ray photoelectron spectroscopy study of neodymium niobate and tantalate precursors and thin films

Surface and Interface Analysis ◽

10.1002/sia.6583 ◽

2018 ◽

Vol 51 (3) ◽

pp. 326-335 ◽

Cited By ~ 4

Author(s):

Helena Brunckova ◽

Hristo Kolev ◽

Maria Kanuchova

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

X Ray

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Instability of NiMoS2 and CoMoS2 Hydrodesulfurization Catalysts at Ambient Conditions: A Quasi in Situ High-Resolution Transmission Electron Microscopy and X-ray Photoelectron Spectroscopy Study

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.6b06030 ◽

2016 ◽

Vol 120 (34) ◽

pp. 19204-19211 ◽

Cited By ~ 8

Author(s):

G. Marien Bremmer ◽

Lennart van Haandel ◽

Emiel J. M. Hensen ◽

Joost W. M. Frenken ◽

Patricia J. Kooyman

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

Ambient Conditions ◽

X Ray ◽

Hydrodesulfurization Catalysts ◽

Transmission Electron

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