Flip-flops soft error rate evaluation approach considering internal single-event transient

Science China Information Sciences ◽

10.1007/s11432-014-5260-z ◽

2015 ◽

Vol 58 (6) ◽

pp. 1-12 ◽

Author(s):

RuiQiang Song ◽

ShuMing Chen ◽

YiBai He ◽

YanKang Du

Keyword(s):

Single Event ◽

Single Event Transient ◽

Soft Error Rate ◽

Evaluation Approach ◽

Rate Evaluation

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Circuit-Level Soft Error Rate Evaluation Approach Considering Single-Event Multiple Transient

2019 IEEE 13th International Conference on ASIC (ASICON) ◽

10.1109/asicon47005.2019.8983536 ◽

2019 ◽

Author(s):

Xiaoyu Zhang ◽

Bin Liang ◽

Ruiqiang Song

Keyword(s):

Single Event ◽

Soft Error Rate ◽

Evaluation Approach ◽

Rate Evaluation

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A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology

IEEE Transactions on Reliability ◽

10.1109/tr.2015.2427372 ◽

2016 ◽

Vol 65 (1) ◽

pp. 248-255 ◽

Author(s):

Yankang Du ◽

Shuming Chen

Keyword(s):

Metal Oxide ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Combinational Circuits ◽

Single Event ◽

Single Event Transient ◽

Soft Error Rate ◽

Bulk Technology

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Synthetic soft error rate simulation considering neutron-induced single event transient from transistor to LSI-chip level

2008 International Conference on Simulation of Semiconductor Processes and Devices ◽

10.1109/sispad.2008.4648313 ◽

2008 ◽

Author(s):

Masami Hane ◽

Hideyuki Nakamura ◽

Katsuhiko Tanaka ◽

Kentaro Watanabe ◽

Yoshiharu Tosaka ◽

...

Keyword(s):

Single Event ◽

Single Event Transient ◽

Soft Error Rate

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A critical re-examination of body-bias on the soft error rate and single-event latch-up in automotive SRAMs

2017 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2017.7936268 ◽

2017 ◽

Author(s):

N. N. Mahatme ◽

B. Min ◽

K. Loiko

Keyword(s):

Single Event ◽

Soft Error Rate ◽

Body Bias ◽

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Alpha-Particle Induced Soft Error Rate Evaluation Tool and User Interface

Simulation of Semiconductor Devices and Processes ◽

10.1007/978-3-7091-6619-2_75 ◽

1995 ◽

pp. 310-313 ◽

Author(s):

P. Oldiges

Keyword(s):

User Interface ◽

Alpha Particle ◽

Evaluation Tool ◽

Soft Error Rate ◽

Rate Evaluation

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Accelerating soft-error-rate (SER) estimation in the presence of single event transients

Proceedings of the 53rd Annual Design Automation Conference on - DAC '16 ◽

10.1145/2897937.2897976 ◽

2016 ◽

Author(s):

Ji Li ◽

Jeffrey Draper

Keyword(s):

Single Event ◽

Soft Error Rate ◽

Single Event Transients

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Accurate alpha soft error rate evaluation in SRAM memories

2013 IEEE 19th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2013.6604080 ◽

2013 ◽

Author(s):

S. A. Bota ◽

G. Torrens ◽

I. de Paul ◽

B. Alorda ◽

L. A. Segura

Keyword(s):

Soft Error Rate ◽

Rate Evaluation

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Physics of Multiple-Node Charge Collection and Impacts on Single-Event Characterization and Soft Error Rate Prediction

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2013.2260357 ◽

2013 ◽

Vol 60 (3) ◽

pp. 1836-1851 ◽

Author(s):

J. D. Black ◽

P. E. Dodd ◽

K. M. Warren

Keyword(s):

Charge Collection ◽

Single Event ◽

Soft Error Rate ◽

Multiple Node ◽

Rate Prediction

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SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations

2013 IEEE 19th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2013.6604066 ◽

2013 ◽

Author(s):

G. Tsiligiannis ◽

Elena I. Vatajelu ◽

L. Dilillo ◽

A. Bosio ◽

P. Girard ◽

...

Keyword(s):

Neutron Radiation ◽

Soft Error Rate ◽

Pvt Variations ◽

Rate Evaluation

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Predictive Soft Error Rate Evaluation System

Simulation of Semiconductor Processes and Devices 1998 ◽

10.1007/978-3-7091-6827-1_97 ◽

1998 ◽

pp. 392-395

Author(s):

Phil Oldiges ◽

Brett Knowlton ◽

Robert Flatley

Keyword(s):

Evaluation System ◽

Soft Error Rate ◽

Rate Evaluation

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