Synthetic soft error rate simulation considering neutron-induced single event transient from transistor to LSI-chip level
2015 ◽
Vol 58
(6)
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pp. 1-12
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2016 ◽
Vol 65
(1)
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pp. 248-255
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Keyword(s):
2013 ◽
Vol 60
(3)
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pp. 1836-1851
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Keyword(s):
Keyword(s):
Keyword(s):
1983 ◽
Vol 4
(6)
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pp. 172-174
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