scholarly journals Electro-physiology Models of Cells with Spherical Geometry with Non-conducting Center

2020 ◽  
Vol 82 (12) ◽  
Author(s):  
Jiamu Jiang ◽  
Paul Smith ◽  
Mark C. W. van Rossum
Keyword(s):  
Current Flow ◽  
Spherical Geometry ◽  
Electrical Current ◽  
Cable Equation ◽  
Electrode Geometry ◽  
Voltage Profile ◽  
Electrical Currents ◽  
Electrical Current Flow ◽  
Sphere Geometry ◽  
Spherical Cells

AbstractWe study the flow of electrical currents in spherical cells with a non-conducting core, so that current flow is restricted to a thin shell below the cell’s membrane. Examples of such cells are fat storing cells (adipocytes). We derive the relation between current and voltage in the passive regime and examine the conditions under which the cell is electro-tonically compact. We compare our results to the well-studied case of electrical current flow in cylinder structures, such as neurons, described by the cable equation. In contrast to the cable, we find that for the sphere geometry (1) the voltage profile across the cell depends critically on the electrode geometry, and (2) the charging and discharging can be much faster than the membrane time constant; however, (3) voltage clamp experiments will incur similar distortion as in the cable case. We discuss the relevance for adipocyte function and experimental electro-physiology.

Electrical current flow at conductive nanowires formed in GaN thin films by a dislocation template technique

2010 ◽  
Vol 96 (19) ◽  
pp. 193109 ◽  
Author(s):  
Shin-ichi Amma ◽  
Yuki Tokumoto ◽  
Keiichi Edagawa ◽  
Naoya Shibata ◽  
Teruyasu Mizoguchi ◽  
...  
Keyword(s):  
Thin Films ◽  
Current Flow ◽  
Electrical Current ◽  
Electrical Current Flow

Effect of Current Direction on the Reliability of Different Capped Cu Interconnects

2005 ◽  
Vol 863 ◽  
Author(s):  
C. L. Gan ◽  
C. Y. Lee ◽  
C. K. Cheng ◽  
J. Gambino
Keyword(s):  
Failure Analysis ◽  
Current Flow ◽  
Void Nucleation ◽  
Electrical Current ◽  
Nucleation Site ◽  
Time To Failure ◽  
Current Direction ◽  
Electron Current ◽  
Electrical Current Flow ◽  
Better Than

AbstractThe reliability of Cu M1-V1-M2-V2-M3 interconnects with SiN and CoWP cap layers was investigated. Similar to previously reported results, the reliability of CoWP capped structures is much better than identical SiN capped structures. However, it was also observed that the reliability of CoWP capped interconnects was independent of the direction of electrical current flow. This phenomenon is different from what was observed for SiN capped structures, where M2 lines with electron current flow in the upstream configuration (“via-below”) have about three times larger median-time-to-failure than identical lines in the downstream configuration (“viaabove”). This is because the Cu/SiN interface is the preferential void nucleation site and provides the fastest diffusion pathway in such an architecture. Failure analysis has shown that fatal partially-spanned voids usually had formed directly below the via for “via-above” configuration, and fully-spanned voids occurred in the lines above the vias for “via-below” configuration.On the other hand, failure analysis for CoWP-coated Cu structures showed that partiallyspanned voids below the via do not cause fatal failures in the downstream configuration. This is because the CoWP layer is conducting, and thus able to shunt current around the void. As a result, a large fully-spanning void is required to cause a failure, just like the upstream configuration. Thus the lifetime of an interconnect with a conducting cap layer is independent of whether the current is flowing upstream or downstream.

scholarly journals Nonconservative current-induced forces: A physical interpretation

2011 ◽  
Vol 2 ◽  
pp. 727-733 ◽  
Author(s):  
Tchavdar N Todorov ◽  
Daniel Dundas ◽  
Anthony T Paxton ◽  
Andrew P Horsfield
Keyword(s):  
Physical Interpretation ◽  
Current Flow ◽  
Test Procedure ◽  
Electrical Current ◽  
Stimulated Emission ◽  
General Definition ◽  
Noninvasive Test ◽  
Electrical Current Flow ◽  
Definition Of ◽  
A Current

We give a physical interpretation of the recently demonstrated nonconservative nature of interatomic forces in current-carrying nanostructures. We start from the analytical expression for the curl of these forces, and evaluate it for a point defect in a current-carrying system. We obtain a general definition of the capacity of electrical current flow to exert a nonconservative force, and thus do net work around closed paths, by a formal noninvasive test procedure. Second, we show that the gain in atomic kinetic energy over time, generated by nonconservative current-induced forces, is equivalent to the uncompensated stimulated emission of directional phonons. This connection with electron–phonon interactions quantifies explicitly the intuitive notion that nonconservative forces work by angular momentum transfer.

scholarly journals Peridynamic Formulation for Coupled Thermoelectric Phenomena

2017 ◽  
Vol 2017 ◽  
pp. 1-10 ◽  
Author(s):  
Migbar Assefa ◽  
Xin Lai ◽  
Lisheng Liu ◽  
Yang Liao
Keyword(s):  
Finite Element Method ◽  
Finite Element ◽  
Partial Differential Equations ◽  
Analytical Solutions ◽  
Current Flow ◽  
Numerical Technique ◽  
Electrical Current ◽  
Numerical Examples ◽  
Electrical Current Flow ◽  
Thermoelectric Convertor

Modeling of heat and electrical current flow simultaneously in thermoelectric convertor using classical theories do not consider the influence of defects in the material. This is because traditional methods are developed based on partial differential equations (PDEs) and lead to infinite fluxes at the discontinuities. The usual way of solving such PDEs is by using numerical technique, like Finite Element Method (FEM). Although FEM is robust and versatile, it is not suitable to model evolving discontinuities. To avoid such shortcomings, we propose the concept of peridynamic theory to derive the balance of energy and charge equations in the coupled thermoelectric phenomena. Therefore, this paper presents the transport of heat and charge in thermoelectric material in the framework of peridynamic (PD) theory. To illustrate the reliability of the PD formulation, numerical examples are presented and results are compared with those from literature, analytical solutions, or finite element solutions.

Design of the Cochlear Prosthesis: Effects of the Flow of Current in the Implanted Ear

1980 ◽  
Vol 89 (2_suppl) ◽  
pp. 8-10 ◽  
Author(s):  
Francis A. Spelman ◽  
Ben M. Clopton ◽  
Bryan E. Pfingst ◽  
Josef M. Miller
Keyword(s):  
Frequency Dependence ◽  
Temporal Bone ◽  
Current Flow ◽  
Dynamic Range ◽  
Electrical Current ◽  
Electrical Stimulus ◽  
Cochlear Prosthesis ◽  
Excitable Cells ◽  
Electrical Currents ◽  
Threshold Functions

When structures within the temporal bone are stimulated electrically it is desirable to maximize the dynamic range of the stimulus. The maximum dynamic range of electrical stimulus seems to be found when the threshold of stimulation is minimum. The minimum threshold of stimulus is likely to be reached when the electrical current that flows through regions containing excitable cells is maximized. By implanting electrodes throughout the temporal bone, it is possible to apply electrical currents to the ear and to measure the distributions of current flowing within the ear. The results of these measurements demonstrate that when current flow is directed outside the scala tympani, lower thresholds can be obtained. Frequency dependence of the paths of current flow canot be used to explain the frequency dependence of the frequency-threshold functions measured in animals.

Bone Formation and Impedance of Electrical Current Flow

1981 ◽  
Vol &NA; (155) ◽  
pp. 196???210 ◽  
Author(s):  
P. C. COLLINS ◽  
D. C. PATERSON ◽  
B. VERNON-ROBERTS ◽  
D. PFEIFFER
Keyword(s):  
Bone Formation ◽  
Current Flow ◽  
Electrical Current ◽  
Electrical Current Flow
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