Characterization of Fatigue Fracture in Ni-20 Pct Cr Alloys Using White Light Interference Microscopy and Scanning Probe Microscopy

Metallurgical and Materials Transactions A ◽

10.1007/s11661-010-0512-z ◽

2010 ◽

Vol 42 (4) ◽

pp. 1073-1088

Author(s):

V. Nalladega ◽

S. Sathish ◽

S. Abburi ◽

M. F. X. Gigliotti ◽

P. R. Subramanian

Keyword(s):

Fatigue Fracture ◽

White Light ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Interference Microscopy ◽

Probe Microscopy ◽

Light Interference ◽

White Light Interference

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Lateral error reduction in the 3D characterization of deep MOEMS devices using white light interference microscopy

10.1117/12.545663 ◽

2004 ◽

Author(s):

Paul C. Montgomery ◽

Denis Montaner ◽

Omar Manzardo ◽

Hans-Peter Herzig

Keyword(s):

White Light ◽

Error Reduction ◽

Interference Microscopy ◽

Light Interference ◽

White Light Interference ◽

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White-light interference microscopy: a way to obtain high lateral resolution over an extended range of heights

Optics Express ◽

10.1364/oe.14.006788 ◽

2006 ◽

Vol 14 (15) ◽

pp. 6788 ◽

Author(s):

Maitreyee Roy ◽

Colin J. R. Sheppard ◽

Guy Cox ◽

Parameswaran Hariharan

Keyword(s):

White Light ◽

Interference Microscopy ◽

Lateral Resolution ◽

Light Interference ◽

High Lateral Resolution ◽

Extended Range ◽

White Light Interference

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Characterization of periodically poled ferroelectric crystals using scanning probe microscopy

Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Technical Digest (IEEE Cat. No.01CH37170) ◽

10.1109/cleo.2001.947615 ◽

2001 ◽

Author(s):

R. Clemens ◽

F. Laurell ◽

H. Karlsson ◽

J. Wittborn ◽

C. Canalias ◽

...

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Periodically Poled ◽

Probe Microscopy ◽

Ferroelectric Crystals

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Model-based white light interference microscopy for metrology of transparent film stacks and optically-unresolved structures

Fringe 2009 ◽

10.1007/978-3-642-03051-2_40 ◽

2009 ◽

pp. 1-8 ◽

Author(s):

Peter de Groot ◽

Xavier Colonna de Lega ◽

Jan Liesener

Keyword(s):

White Light ◽

Interference Microscopy ◽

Transparent Film ◽

Model Based ◽

Light Interference ◽

White Light Interference

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Characterization of CVD-synthesized graphene films transferred on different substrates using the scanning probe microscopy electrical techniques

Physica E Low-dimensional Systems and Nanostructures ◽

10.1016/j.physe.2021.115101 ◽

2021 ◽

pp. 115101

Author(s):

Yu.V. Korkh ◽

A.B. Rinkevich ◽

A.S. Klepikova ◽

E.A. Tolmacheva ◽

E.A. Pankrushina

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

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Scanning Probe Microscopy Characterization of Cluster Systems

Low-Dimensional Systems: Theory, Preparation, and Some Applications ◽

10.1007/978-94-010-0143-4_20 ◽

2003 ◽

pp. 253-265

Author(s):

Wanda Polewska ◽

Ryszard Czajka ◽

Jarosław Gutek ◽

T. Hihara ◽

A. Kasuya

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Cluster Systems ◽

Probe Microscopy ◽

Microscopy Characterization

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Measuring the Refractive Index and Its Two-Dimensional Distribution of Picoliter Microfluidics With the Scanning White Light Interference Microscopy Method

IEEE Access ◽

10.1109/access.2020.3030959 ◽

2020 ◽

Vol 8 ◽

pp. 190553-190558

Author(s):

Mengrou Xia ◽

Rongyao Wu ◽

Wei Zhan ◽

Xiaoyuan Ji ◽

Lianbo Guo ◽

...

Keyword(s):

Refractive Index ◽

White Light ◽

Interference Microscopy ◽

Two Dimensional ◽

Light Interference ◽

Dimensional Distribution ◽

Microscopy Method ◽

White Light Interference

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Characterization of thermally oxidized carbon fibre surfaces by ESCA, wetting techniques and scanning probe microscopy, and the interaction with polyethylmethacrylate. Development of a biocompatible composite material

10.1016/0010-4361(94)90213-5 ◽

1994 ◽

Vol 25 (7) ◽

pp. 763-769 ◽

Author(s):

J. Mayer ◽

S. Giorgetta ◽

B. Koch ◽

E. Wintermantel ◽

J. Patscheider ◽

...

Keyword(s):

Composite Material ◽

Carbon Fibre ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Oxidized Carbon

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Electrical characterization of semiconductor nanowires by scanning-probe microscopy

Semiconductor Nanowires ◽

10.1016/b978-1-78242-253-2.00010-4 ◽

2015 ◽

pp. 277-304 ◽

Author(s):

T. Xu ◽

B. Grandidier

Keyword(s):

Scanning Probe Microscopy ◽

Electrical Characterization ◽

Semiconductor Nanowires ◽

Scanning Probe ◽

Probe Microscopy

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Characterization of Catalysts by Advanced Scanning Probe Microscopy and Spectroscopy

ChemCatChem ◽

10.1002/cctc.201901877 ◽

2020 ◽

Vol 12 (14) ◽

pp. 3601-3620

Author(s):

Yao Sun ◽

Kaiyang Zeng

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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