Integrating In Situ x-Ray Imaging, Energy Dispersive Spectroscopy, and Calculated Phase Diagram Analysis of Solute Segregation During Solidification of an Al-Ag Alloy

JOM ◽  
2021 ◽  
Author(s):  
C. Gus Becker ◽  
Damien Tourret ◽  
Doug Smith ◽  
Brian Rodgers ◽  
Seth Imhoff ◽  
...  
Keyword(s):  
Phase Diagram ◽  
Energy Dispersive Spectroscopy ◽  
Calculated Phase Diagram ◽  
Solute Segregation ◽  
Energy Dispersive ◽  
Calculated Phase ◽  
X Ray ◽  
X Ray Imaging ◽  
Diagram Analysis

scholarly journals A novel experimental setup for in situ optical and X-ray imaging of laser sintering of polymer particles

2019 ◽  
Vol 90 (8) ◽  
pp. 083905 ◽  
Author(s):  
Prakhyat Hejmady ◽  
Lucien C. Cleven ◽  
Lambèrt C. A. van Breemen ◽  
Patrick D. Anderson ◽  
Ruth Cardinaels
Keyword(s):  
Laser Sintering ◽  
Experimental Setup ◽  
Polymer Particles ◽  
X Ray ◽  
X Ray Imaging

Elemental hair analysis using nuclear microscopy and X-ray energy dispersive spectroscopy

The Analyst ◽  
1995 ◽  
Vol 120 (3) ◽  
pp. 783 ◽  
Author(s):  
Jill A. Cargnello ◽  
Jonathan J. Powell ◽  
Richard P. H. Thompson ◽  
Peter R. Crocker ◽  
Frank Watt
Keyword(s):  
Energy Dispersive Spectroscopy ◽  
Hair Analysis ◽  
Energy Dispersive ◽  
X Ray ◽  
Nuclear Microscopy

scholarly journals Ammonothermal Synthesis of Earth-Abundant Nitride Semiconductors ZnSiN2 and ZnGeN2 and Dissolution Monitoring by In Situ X-ray Imaging

2017 ◽  
Vol 23 (50) ◽  
pp. 12275-12282 ◽  
Author(s):  
Jonas Häusler ◽  
Saskia Schimmel ◽  
Peter Wellmann ◽  
Wolfgang Schnick
Keyword(s):  
Nitride Semiconductors ◽  
X Ray ◽  
X Ray Imaging ◽  
Earth Abundant

Composition Analysis of Ge/Si1-xGex: C Buffer on Silicon Measured by Planar Scanning Energy Dispersive Spectroscopy

2011 ◽  
Vol 383-390 ◽  
pp. 7619-7623
Author(s):  
Z Z Lu ◽  
F. Yu ◽  
L. Yu ◽  
L. H. Cheng ◽  
P. Han
Keyword(s):  
Energy Dispersive Spectroscopy ◽  
Chemical Vapor ◽  
Energy Dispersive ◽  
Composition Analysis ◽  
X Ray Diffraction ◽  
Si Substrate ◽  
Composition Distribution ◽  
X Ray ◽  
Cvd Method ◽  
Substrate Structure

In this work, Si, Ge element composition distribution in Ge /Si1-xGex:C /Si substrate structure has been characterized and modified by planar scanning energy dispersive spectroscopy (EDS) and X-ray diffraction (XRD). The Ge /Si1-xGex:C /Si substrate samples are grown by chemical vapor deposition (CVD) method. The accuracy of EDS value can be improved by ~ 32%. And the modified EDS results indicate the Ge distribution in the Ge/Si1-xGex:C/Si sub structure.

scholarly journals Exploration of the NaxMoO2phase diagram for low sodium contents (x≤ 0.5)

2018 ◽  
Vol 6 (30) ◽  
pp. 14651-14662 ◽  
Author(s):  
Laura Vitoux ◽  
Marie Guignard ◽  
Jacques Darriet ◽  
Claude Delmas
Keyword(s):  
Phase Diagram ◽  
Powder Diffraction ◽  
X Ray ◽  
Low Sodium

Phase diagram in the NaxMoO2system (x≤ 0.5) determined using electrochemistry andin situX-ray powder diffraction.

scholarly journals In Situ Analysis of Laser Powder Bed Fusion Using Simultaneous High-Speed Infrared and X-ray Imaging

JOM ◽  
2020 ◽  
Vol 73 (1) ◽  
pp. 201-211 ◽  
Author(s):  
Benjamin Gould ◽  
Sarah Wolff ◽  
Niranjan Parab ◽  
Cang Zhao ◽  
Maria Cinta Lorenzo-Martin ◽  
...  
Keyword(s):  
High Speed ◽  
In Situ Analysis ◽  
Powder Bed Fusion ◽  
Laser Powder Bed Fusion ◽  
Powder Bed ◽  
X Ray ◽  
X Ray Imaging

In situ strain profiling of elastoplastic bending in Ti–6Al–4V alloy by synchrotron energy dispersive x-ray diffraction

2009 ◽  
Vol 105 (9) ◽  
pp. 093505 ◽  
Author(s):  
M. Croft ◽  
V. Shukla ◽  
E. K. Akdoğan ◽  
N. Jisrawi ◽  
Z. Zhong ◽  
...  
Keyword(s):  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray ◽  
Elastoplastic Bending
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