3D Non-Destructive Characterization of Electrical Steels for Quantitative Texture Analysis with Lab-Based X-ray Diffraction Contrast Tomography

Author(s):  
Jun Sun ◽  
Ivan Petryshynets ◽  
Li Meng ◽  
Ning Zhang ◽  
Yang Li ◽  
...  
2020 ◽  
Vol 22 (37) ◽  
pp. 20972-20989 ◽  
Author(s):  
Amy C. Marschilok ◽  
Andrea M. Bruck ◽  
Alyson Abraham ◽  
Chavis A. Stackhouse ◽  
Kenneth J. Takeuchi ◽  
...  

This review highlights the efficacy of EDXRD as a non-destructive characterization tool in elucidating system-level phenomena for batteries.


Nano Energy ◽  
2019 ◽  
Vol 62 ◽  
pp. 11-19 ◽  
Author(s):  
Kang Dong ◽  
Markus Osenberg ◽  
Fu Sun ◽  
Henning Markötter ◽  
Charl J. Jafta ◽  
...  

Author(s):  
A. K. Agrawal ◽  
P. S. Sarkar ◽  
Y. S. Kashyap ◽  
B. Singh ◽  
A. Sharma ◽  
...  

2020 ◽  
Vol 76 (6) ◽  
pp. 652-663 ◽  
Author(s):  
H. Fang ◽  
D. Juul Jensen ◽  
Y. Zhang

Laboratory X-ray diffraction contrast tomography (LabDCT) has recently been developed as a powerful technique for non-destructive mapping of grain microstructures in bulk materials. As the grain reconstruction relies on segmentation of diffraction spots, it is essential to understand the physics of the diffraction process and resolve all the spot features in detail. To this aim, a flexible and standalone forward simulation model has been developed to compute the diffraction projections from polycrystalline samples with any crystal structure. The accuracy of the forward simulation model is demonstrated by good agreements in grain orientations, boundary positions and shapes between a virtual input structure and that reconstructed based on the forward simulated diffraction projections of the input structure. Further experimental verification is made by comparisons of diffraction spots between simulations and experiments for a partially recrystallized Al sample, where a satisfactory agreement is found for the spot positions, sizes and intensities. Finally, applications of this model to analyze specific spot features are presented.


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