Non-destructive characterization of recrystallization kinetics using three-dimensional X-ray diffraction microscopy

2006 ◽  
Vol 55 (1) ◽  
pp. 51-56 ◽  
Author(s):  
E.M. Lauridsen ◽  
S. Schmidt ◽  
S.F. Nielsen ◽  
L. Margulies ◽  
H.F. Poulsen ◽  
...  
Keyword(s):  
Three Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
Recrystallization Kinetics ◽  
Non Destructive ◽  
Diffraction Microscopy ◽  
Non Destructive Characterization

Three Dimensional Characterization of Grain Structures by EBSP and 3DXRD

2007 ◽  
Vol 558-559 ◽  
pp. 751-756 ◽  
Author(s):  
Kristofer Hannesson ◽  
Dorte Juul Jensen
Keyword(s):  
Three Dimensional ◽  
Polycrystalline Materials ◽  
Serial Sectioning ◽  
X Ray Diffraction ◽  
X Ray ◽  
3D Structures ◽  
3 Dimensional ◽  
Grain Structures ◽  
Non Destructive

Grain structures in polycrystalline materials are typically three dimensional (3D) structures, but by far the most characterizations of grain structures are done by microscopy and are thus limited to 2D. In the present work 3D grain structures in a well-annealed cylindrical aluminium (AA1050) sample is characterized and analyzed. The characterization is done by 2 methods i) by non-destructive 3-dimensional x-ray diffraction (3DXRD) ii) by serial sectioning and subsequent EBSP mapping of entire circular 2D sample sections; 50 sections are mapped In total 333 grains are reconstructed. It is found that the 3D grain morphologies can be quite complex in particular for the larger grains, the number of neighbours varies significantly and values above 20 are not unusual. When the results from the 2 methods are compared, it is found that the crystallographic agreement is very good and within experimental uncertainties. Slightly more significant differences are found when the reconstructed grain morphologies are compared. Reasons for this are discussed.

scholarly journals Non-destructive characterization of additively manufactured components with x-ray computed tomography for part qualification: A study with laboratory and synchrotron x-rays

2021 ◽  
Vol 173 ◽  
pp. 110894
Author(s):  
Ercan Cakmak ◽  
Philip Bingham ◽  
Ross W. Cunningham ◽  
Anthony D. Rollett ◽  
Xianghui Xiao ◽  
...  
Keyword(s):  
Computed Tomography ◽  
X Rays ◽  
X Ray ◽  
X Ray Computed ◽  
Non Destructive ◽  
Non Destructive Characterization

scholarly journals Energy dispersive X-ray diffraction (EDXRD) for operando materials characterization within batteries

2020 ◽  
Vol 22 (37) ◽  
pp. 20972-20989 ◽  
Author(s):  
Amy C. Marschilok ◽  
Andrea M. Bruck ◽  
Alyson Abraham ◽  
Chavis A. Stackhouse ◽  
Kenneth J. Takeuchi ◽  
...  
Keyword(s):  
Materials Characterization ◽  
Energy Dispersive ◽  
System Level ◽  
X Ray Diffraction ◽  
X Ray ◽  
Non Destructive ◽  
Non Destructive Characterization

This review highlights the efficacy of EDXRD as a non-destructive characterization tool in elucidating system-level phenomena for batteries.

scholarly journals Three-dimensional coherent X-ray diffraction microscopy

2012 ◽  
Vol 6 (2) ◽  
pp. 437-441
Author(s):  
Kailash Kumar Mahto
Keyword(s):  
Three Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Microscopy
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