Charge distribution among non-spherical particles in a bipolar ion environment

1994 ◽  
Vol 25 (4) ◽  
pp. 611-615 ◽  
Author(s):  
A.V. Filippov
1997 ◽  
Vol 28 ◽  
pp. S653-S654
Author(s):  
Yu-Chen Chang ◽  
Jui-Chen Lin ◽  
J.W. Gentry

2021 ◽  
Vol 153 ◽  
pp. 105705
Author(s):  
Tyler J. Johnson ◽  
Robert T. Nishida ◽  
Xiao Zhang ◽  
Jonathan P.R. Symonds ◽  
Jason S. Olfert ◽  
...  

1989 ◽  
Vol 20 (8) ◽  
pp. 1095-1098 ◽  
Author(s):  
J-R. Pao ◽  
C.C. Wang ◽  
T.G. Cleary ◽  
J.W. Gentry

Author(s):  
J. Taft∅

It is well known that for reflections corresponding to large interplanar spacings (i.e., sin θ/λ small), the electron scattering amplitude, f, is sensitive to the ionicity and to the charge distribution around the atoms. We have used this in order to obtain information about the charge distribution in FeTi, which is a candidate for storage of hydrogen. Our goal is to study the changes in electron distribution in the presence of hydrogen, and also the ionicity of hydrogen in metals, but so far our study has been limited to pure FeTi. FeTi has the CsCl structure and thus Fe and Ti scatter with a phase difference of π into the 100-ref lections. Because Fe (Z = 26) is higher in the periodic system than Ti (Z = 22), an immediate “guess” would be that Fe has a larger scattering amplitude than Ti. However, relativistic Hartree-Fock calculations show that the opposite is the case for the 100-reflection. An explanation for this may be sought in the stronger localization of the d-electrons of the first row transition elements when moving to the right in the periodic table. The tabulated difference between fTi (100) and ffe (100) is small, however, and based on the values of the scattering amplitude for isolated atoms, the kinematical intensity of the 100-reflection is only 5.10-4 of the intensity of the 200-reflection.


Author(s):  
Daniel UGARTE

Small particles exhibit chemical and physical behaviors substantially different from bulk materials. This is due to the fact that boundary conditions can induce specific constraints on the observed properties. As an example, energy loss experiments carried out in an analytical electron microscope, constitute a powerful technique to investigate the excitation of collective surface modes (plasmons), which are modified in a limited size medium. In this work a STEM VG HB501 has been used to study the low energy loss spectrum (1-40 eV) of silicon spherical particles [1], and the spatial localization of the different modes has been analyzed through digitally acquired energy filtered images. This material and its oxides have been extensively studied and are very well characterized, because of their applications in microelectronics. These particles are thus ideal objects to test the validity of theories developed up to now.Typical EELS spectra in the low loss region are shown in fig. 2 and energy filtered images for the main spectral features in fig. 3.


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