Electron-beam evaporation and interface characterization of Bi2Sr2Ca1Cu2Oy thin films on SrTiO3- and Si-substrates

1990 ◽  
Vol 164-165 ◽  
pp. 671-678 ◽  
Author(s):  
V Klocke ◽  
A Pfau ◽  
W Albrecht ◽  
C Valder ◽  
U Breuer ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Electron Beam Evaporation ◽  
Interface Characterization ◽  
Si Substrates

On the Growth and Physical-chemical Characterization of Tb5Si2Ge2 Thin Films Produced by Electron-beam Evaporation

2015 ◽  
Vol 2 (1) ◽  
pp. 26-32
Author(s):  
A.L. Pires ◽  
J.H. Belo ◽  
I.T. Gomes ◽  
L. Fernandes ◽  
P.B. Tavares ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Chemical Characterization ◽  
Electron Beam Evaporation ◽  
Physical Chemical

Characterization of Nd:Y3Al5O12 Thin Films Prepared by Electron Beam Evaporation Deposition

2013 ◽  
Vol 320 ◽  
pp. 150-154
Author(s):  
Hao Ren ◽  
Qun Zeng ◽  
Xi Hui Liang
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Room Temperature ◽  
Electron Beam Evaporation ◽  
Photoluminescence Spectra ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surface Morphologies ◽  
Ingaas Detector

Nd:YAG thin films have been prepared on Si (100) substrates by electron beam evaporation deposition. The surface morphologies, crystalline phases and optical properties of the Nd:YAG thin films were characterized by x-ray diffraction, scanning electron microscopy, photoluminescence spectroscopy, and spectrophotometer. The crystallization of Nd:YAG thin films was improved after annealing at 1100 °C for 1 hour in vacuum. Excited by a Ti:sapphire laser at 808 nm, photoluminescence spectra of Nd:YAG thin films were measured at room temperature, and the transition of4F3/24I11/2of Nd3+in YAG in the region of 1064 nm were detected by a liquid nitrogen cooled InGaAs detector array.

Preparation and characterization of indium zinc oxide thin films by electron beam evaporation technique

2011 ◽  
Vol 46 (4) ◽  
pp. 615-620 ◽  
Author(s):  
Reza Keshavarzi ◽  
Valiollah Mirkhani ◽  
Majid Moghadam ◽  
Shahram Tangestaninejad ◽  
Iraj Mohammadpoor-Baltork ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Electron Beam ◽  
Electron Beam Evaporation ◽  
Oxide Thin Films ◽  
Indium Zinc Oxide ◽  
Electron Beam Evaporation Technique ◽  
Evaporation Technique

Physical characterization of In2Se3 thin films prepared by electron beam evaporation

Vacuum ◽  
1995 ◽  
Vol 46 (8-10) ◽  
pp. 997-1000 ◽  
Author(s):  
D Manno ◽  
G Micocci ◽  
R Rella ◽  
P Siciliano ◽  
A Tepore
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Electron Beam Evaporation ◽  
Physical Characterization
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