Hydrogen depth profile in sputtered CuxZr1-x amorphous alloys studied by nuclear reaction analysis. Evolution as a function of annealing temperature.

1986 ◽  
Vol 57 (1) ◽  
pp. 59-61 ◽  
Author(s):  
M. Fallavier ◽  
J.P. Thomas ◽  
J.M. Frigerio ◽  
J. Rivory
Keyword(s):  
Nuclear Reaction ◽  
Depth Profile ◽  
Amorphous Alloys ◽  
Annealing Temperature ◽  
Nuclear Reaction Analysis

Interaction of Deuterium with Buried Oxides in Silicon

1987 ◽  
Vol 107 ◽  
Author(s):  
S. M. Myers
Keyword(s):  
Ion Implantation ◽  
Nuclear Reaction ◽  
Depth Profile ◽  
Nuclear Reaction Analysis ◽  
Measurable Quantity ◽  
Buried Oxide ◽  
Hydrogen Exposure ◽  
Deuterium Gas ◽  
Defect Densities ◽  
Zone Melt

AbstractSilicon with buried oxides formed by ion implantation (SIMOX) or zone-melt recrystallization (ZMR) was exposed to deuterium gas at temperatures from 773 K to 1273 K, and the depth profile of the D was then determined by nuclear-reaction analysis. The D was localized within the buried oxide, with no measurable quantity in the Si phase. Uptake was controlled by permeation through the Si overlayer, and the permeability of D in Si was determined at 873 K. The sample dependence of D uptake indicated substantially fewer defect-trap sites in SIMOX oxide annealed at 1678 K as opposed to 1548 K, with still smaller defect densities in the ZMR oxide. Hydrogen exposure at 1273 K substantially disrupted the SIMOX structures.

Light Impurity Depth Profiling in the Nuclear Reaction AnalysiS

1993 ◽  
Vol 316 ◽  
Author(s):  
Oleg I. Zabashta ◽  
A.I. Kul'ment'ev ◽  
V.E. Storizko
Keyword(s):  
Nuclear Reaction ◽  
Depth Profile ◽  
General Problem ◽  
Depth Profiling ◽  
Measured Data ◽  
Point Of View ◽  
Nuclear Reaction Analysis ◽  
Incorrect Problem ◽  
Non Destructive ◽  
Non Destructive Techniques

The general problem in the analysis of a sample by non-destructive techniques such as nuclear microanalysis, ellipsometry, etc. is the interpretation of the measured data. The impurity depth profile obtained may noticeable non-physical fluctuations. From the mathematical point of view this could be explain by the fact that while interpreting the results we have to solve an incorrect problem to which routine computational methods are not applicable.

scholarly journals Depth Profile Measurements of Hydrogen Isotopes near the Surface of the TFTR Plasma Facing Component using Nuclear Reaction Analysis

2005 ◽  
Vol 81 (4) ◽  
pp. 296-301
Author(s):  
Naoyoshi KUBOTA ◽  
Kentaro OCHIAI ◽  
Tyuzo KUTSUKAKE ◽  
Takao HAYASHI ◽  
Wataru SHU ◽  
...  
Keyword(s):  
Nuclear Reaction ◽  
Depth Profile ◽  
Hydrogen Isotopes ◽  
Nuclear Reaction Analysis ◽  
Plasma Facing Component

Hydrogen release from irradiated elastomers measured by Nuclear Reaction Analysis

2016 ◽  
Vol 371 ◽  
pp. 216-219 ◽  
Author(s):  
J. Jagielski ◽  
U. Ostaszewska ◽  
D.M. Bielinski ◽  
D. Grambole ◽  
M. Romaniec ◽  
...  
Keyword(s):  
Nuclear Reaction ◽  
Hydrogen Release ◽  
Nuclear Reaction Analysis

scholarly journals In-Situ Ion Beam Measurements of Deuterium Loading in Thin Foil Electrochemical Cells

1989 ◽  
Vol 157 ◽  
Author(s):  
J.A. Knapp ◽  
T.R. Guilinger ◽  
M.J. Kelly ◽  
D. Walsh ◽  
B.L. Doyle
Keyword(s):  
Nuclear Reaction ◽  
Ion Beam ◽  
Cold Fusion ◽  
Thin Foil ◽  
Nuclear Reaction Analysis ◽  
Deuterium Content ◽  
Electrochemical Cells ◽  
External Beam

ABSTRACTA key element of recent assertions of "cold fusion" has been the claim that electrochemical loading of deuterium into Pd electrodes can produce D:Pd levels exceeding 1:1. Using external beam nuclear reaction analysis of Pd foil electrodes in operating electrochemical cells, we have directly monitored deuterium content in-situ. No conditions were found which resulted in loadings higher than ∼0.9.

Sign in / Sign up

Export Citation Format

Share Document