HV-TEM in-situ investigations of the tip shape of indium liquid metal ion emitter

1994 ◽  
Vol 314 (3) ◽  
pp. 353-364 ◽  
Author(s):  
B. Praprotnik ◽  
W. Driesel ◽  
Ch. Dietzsch ◽  
H. Niedrig
Keyword(s):  
1996 ◽  
Vol 93 (2) ◽  
pp. 179-190 ◽  
Author(s):  
W. Driesel ◽  
Ch. Dietzsch
Keyword(s):  

1984 ◽  
Vol 45 (C9) ◽  
pp. C9-207-C9-209 ◽  
Author(s):  
A. R. Waugh ◽  
S. Payne ◽  
G. M. Worrall ◽  
G. D.W. Smith

1995 ◽  
Vol 57 (1) ◽  
pp. 45-58 ◽  
Author(s):  
W. Driesel ◽  
Ch. Dietzsch ◽  
H. Niedrig ◽  
B. Praprotnik

1984 ◽  
Vol 45 (C9) ◽  
pp. C9-179-C9-182
Author(s):  
G. L.R. Mair ◽  
T. Mulvey ◽  
R. G. Forbes

1989 ◽  
Vol 50 (C8) ◽  
pp. C8-175-C8-177 ◽  
Author(s):  
N. M. MISKOVSKY ◽  
J. HE ◽  
P. H. CUTLER ◽  
M. CHUNG
Keyword(s):  

1983 ◽  
Vol 140 (5) ◽  
pp. 137 ◽  
Author(s):  
M.D. Gabovich
Keyword(s):  

Carbon ◽  
2021 ◽  
Vol 177 ◽  
pp. 428
Author(s):  
Xiaoqin Cheng ◽  
Huijun Li ◽  
Zhenxin Zhao ◽  
Yong-zhen Wang ◽  
Xiaomin Wang

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Tammy Chang ◽  
Saptarshi Mukherjee ◽  
Nicholas N. Watkins ◽  
David M. Stobbe ◽  
Owen Mays ◽  
...  

AbstractThis article presents a millimeter-wave diagnostic for the in-situ monitoring of liquid metal jetting additive manufacturing systems. The diagnostic leverages a T-junction waveguide device to monitor impedance changes due to jetted metal droplets in real time. An analytical formulation for the time-domain T-junction operation is presented and supported with a quasi-static full-wave electromagnetic simulation model. The approach is evaluated experimentally with metallic spheres of known diameters ranging from 0.79 to 3.18 mm. It is then demonstrated in a custom drop-on-demand liquid metal jetting system where effective droplet diameters ranging from 0.8 to 1.6 mm are detected. Experimental results demonstrate that this approach can provide information about droplet size, timing, and motion by monitoring a single parameter, the reflection coefficient amplitude at the input port. These results show the promise of the impedance diagnostic as a reliable in-situ characterization method for metal droplets in an advanced manufacturing system.


2016 ◽  
Vol 87 (2) ◽  
pp. 02A913
Author(s):  
M. J. Segal ◽  
R. A. Bark ◽  
R. Thomae ◽  
E. E. Donets ◽  
E. D. Donets ◽  
...  

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