Stability of structural defects of polycrystalline silicon grown by rapid thermal annealing of amorphous silicon films
1997 ◽
Vol 12
(10)
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pp. 2511-2514
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1994 ◽
Vol 37-38
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pp. 287-292
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2013 ◽
Vol 24
(11)
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pp. 4209-4212
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2000 ◽
Vol 39
(Part 2, No. 1A/B)
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pp. L19-L21
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1998 ◽
Vol 135
(1-4)
◽
pp. 205-208
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1993 ◽
Vol 8
(3)
◽
pp. 327-332
◽
2001 ◽
Vol 40
(Part 1, No. 4A)
◽
pp. 2150-2154
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Keyword(s):
1996 ◽
Vol 8
(3)
◽
pp. 273-286
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Keyword(s):