Structural characterization of PbTiO3 thin films prepared by ion beam induced CVD and evaporation of lead

1996 ◽  
Vol 272 (1) ◽  
pp. 99-106 ◽  
Author(s):  
D. Leinen ◽  
A. Caballero ◽  
A. Fernández ◽  
J.P. Espinós ◽  
A. Justo ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
Ion Beam

Structural characterization of epitaxial Cd1−xZnxTe semiconductor thin films by ion beam techniques

2003 ◽  
Vol 253 (1-4) ◽  
pp. 89-94 ◽  
Author(s):  
F. Fernández-Lima ◽  
E.M. Larramendi ◽  
E. Purón ◽  
E. Pedrero ◽  
O. de Melo ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
Ion Beam ◽  
Semiconductor Thin Films

Fluorescence-Detected X-Ray Absorption Spectroscopy Applied to Structural Characterization of Very Thin Films; Ion-Beam-Induced Modification of Thin Ni Layers on Si(100)

1985 ◽  
Vol 24 (Part 1, No. 5) ◽  
pp. 610-619 ◽  
Author(s):  
Hiroyuki Oyanagi ◽  
Tadashi Matsushita ◽  
Hisao Tanoue ◽  
Takehiko Ishiguro ◽  
Kazutake Kohra
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Structural Characterization ◽  
Ion Beam ◽  
X Ray ◽  
X Ray Absorption

Structural characterization of V2O5–TiO2 thin films deposited by RF sputtering from a titanium target with vanadium insets

2005 ◽  
Vol 109 (1) ◽  
pp. 47-51 ◽  
Author(s):  
I. Alessandri ◽  
E. Comini ◽  
E. Bontempi ◽  
G. Sberveglieri ◽  
L.E. Depero
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
Rf Sputtering ◽  
Tio2 Thin Films ◽  
Titanium Target

Structural characterization of electrodeposited EuSe thin films

2001 ◽  
Vol 36 (15) ◽  
pp. 2613-2626 ◽  
Author(s):  
N.S Gaikwad ◽  
C.H Bhosale
Keyword(s):  
Thin Films ◽  
Structural Characterization

Reactive UHV Sputtering and Structural Characterization of Epitaxial AlN/6H-SiC(0001) Thin Films

1998 ◽  
Vol 264-268 ◽  
pp. 1225-1228 ◽  
Author(s):  
Sukkaneste Tungasmita ◽  
Jens Birch ◽  
L. Hultman ◽  
Erik Janzén ◽  
J.-E. Sundgren
Keyword(s):  
Thin Films ◽  
Structural Characterization

Optical absorption and structural characterization of reactively sputtered tellurium suboxide thin films

1993 ◽  
Vol 65-66 ◽  
pp. 313-318 ◽  
Author(s):  
M. Di Giulio ◽  
M.C. Nicotra ◽  
M. Re ◽  
R. Rella ◽  
P. Siciliano
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Structural Characterization

Preparation and Structural Characterization of hcp and fcc Ni Epitaxial Thin Films on Ru Underlayers with Different Orientations

2011 ◽  
Vol 50 (6) ◽  
pp. 063001 ◽  
Author(s):  
Jumpei Higuchi ◽  
Mitsuru Ohtake ◽  
Yoichi Sato ◽  
Tsutomu Nishiyama ◽  
Masaaki Futamoto
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
Epitaxial Thin Films
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