Surface structure analysis of Si(111)−Bi by X-ray diffraction — Approach to the solution of the phase problem

1987 ◽  
Vol 191 (3) ◽  
pp. L825-L834 ◽  
Author(s):  
Toshio Takahashi ◽  
Shinichiro Nakatani ◽  
Tetsuya Ishikawa ◽  
Seishi Kikuta
Keyword(s):  
Surface Structure ◽  
Structure Analysis ◽  
Phase Problem ◽  
X Ray Diffraction ◽  
X Ray

Surface structure analysis of Si(111)√3 × √3-Bi by X-ray diffraction — Approach to the solution of the phase problem

1987 ◽  
Vol 191 (3) ◽  
pp. L825-L834 ◽  
Author(s):  
Toshio Takahashi ◽  
Shinichiro Nakatani ◽  
Tetsuya Ishikawa ◽  
Seishi Kikuta
Keyword(s):  
Surface Structure ◽  
Structure Analysis ◽  
Phase Problem ◽  
X Ray Diffraction ◽  
X Ray

The Kepler tiling as the oldest complex surface structure in history: X-ray structure analysis of a two-dimensional oxide quasicrystal approximant

2016 ◽  
Vol 231 (12) ◽  
Author(s):  
Sumalay Roy ◽  
Katayoon Mohseni ◽  
Stefan Förster ◽  
Martin Trautmann ◽  
Florian Schumann ◽  
...  
Keyword(s):  
Surface Structure ◽  
Structure Analysis ◽  
Complex Surface ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
X Ray

Abstract:We have carried out a surface X-ray diffraction (SXRD) analysis of the approximant structure related to the recently discovered two-dimensional dodecagonal oxidic quasicrystal. The structure is characterized by the 3

scholarly journals Structure Factor Determination in Surface X-ray Diffraction

1988 ◽  
Vol 41 (3) ◽  
pp. 359 ◽  
Author(s):  
LK Robinson
Keyword(s):  
Data Collection ◽  
Surface Structure ◽  
Structure Analysis ◽  
Structure Factor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surface Diffraction

A set of formulae is derived for correcting integrated diffraction intensities for surface structure analysis. These differ significantly from their bulk counterparts because of the diffuse nature of the peaks. In-plane and out-of-p1ane data collection are treated separately. Measurements of W(OOl) surface diffraction are used as a case study.

scholarly journals Surface Structure Analysis of Si(111)(.RAD.3*.RAD.3)R30.DEG.-Ag by X-Ray Diffraction.

Hyomen Kagaku ◽  
1992 ◽  
Vol 13 (1) ◽  
pp. 2-9
Author(s):  
Toshio TAKAHASHI ◽  
Shlnichiro NAKATANI
Keyword(s):  
Surface Structure ◽  
Structure Analysis ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Synchrotron Nano-Diffraction Study of Thermally Treated Asbestos Tremolite from Val d’Ala, Turin (Italy)

Minerals ◽  
2018 ◽  
Vol 8 (8) ◽  
pp. 311 ◽  
Author(s):  
Carlotta Giacobbe ◽  
Jonathan Wright ◽  
Dario Di Giuseppe ◽  
Alessandro Zoboli ◽  
Mauro Zapparoli ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Heat Treatment ◽  
Risk Management ◽  
Structure Analysis ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Adverse Health Effects ◽  
Nano Crystalline ◽  
Original Fibre

Nowadays, due to the adverse health effects associated with exposure to asbestos, its removal and thermal inertization has become one of the most promising ways for reducing waste risk management. Despite all the advances in structure analysis of fibers and characterization, some problems still remain that are very hard to solve. One challenge is the structure analysis of natural micro- and nano-crystalline samples, which do not form crystals large enough for single-crystal X-ray diffraction (SC-XRD), and their analysis is often hampered by reflection overlap and the coexistence of multiple fibres linked together. In this paper, we have used nano-focused synchrotron X-rays to refine the crystal structure of a micrometric tremolite fibres from Val d’Ala, Turin (Italy) after various heat treatment. The structure of the original fibre and after heating to 800 °C show minor differences, while the fibre that was heated at 1000 °C is recrystallized into pyroxene phases and cristobalite.

scholarly journals The surface structure of model catalyst in action investigated by X-ray diffraction

2005 ◽  
Vol 61 (a1) ◽  
pp. c8-c8
Author(s):  
S. Ferrer ◽  
M. D. Ackermann ◽  
O. Robach ◽  
B. L. M. Hendriksen ◽  
I. Popa ◽  
...  
Keyword(s):  
Surface Structure ◽  
Model Catalyst ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals The Use of Connected Masks for Reconstructing the Single Particle Image from X-Ray Diffraction Data. II. The Dependence of the Accuracy of the Solution on the Sampling Step of Experimental Data

2015 ◽  
Vol 10 (2) ◽  
pp. 508-525 ◽  
Author(s):  
Н.Л. Лунина ◽  
N.L. Lunina
Keyword(s):  
Experimental Data ◽  
Particle Image ◽  
Expected Improvement ◽  
Problem Solution ◽  
Phase Problem ◽  
X Ray Diffraction ◽  
Sampling Step ◽  
X Ray ◽  
X Ray Crystallography ◽  
Grid Points

Advances in the methodology of the X-ray diffraction experiments leads to a possibility to register the rays scattered by large isolated biological particles (viruses and individual cells) but not only by crystalline samples. The experiment with an isolated particle provides researchers with the intensities of the scattered rays for the continuous spectrum of scattering vectors. Such experiment gives much more experimental data than an experiment with a crystalline sample where the information is limited to a set of Bragg reflections. This opens up additional opportunities in solving underlying problem of X-ray crystallography, namely, calculating phase values for the scattered waves needed to restore the structure of the object under study. In practice, the original continuous diffraction pattern is sampled, reduced to the values at grid points in the space of scattering vectors (in the reciprocal space). The sampling step determines the amount of the information involved in solving the phase problem and the complexity of the necessary calculations. In this paper, we investigate the effect of the sampling step on the accuracy of the phase problem solution obtained by the method proposed earlier by the authors. It is shown that an expected improvement of the accuracy of the solution with the reducing the sampling step continues even after crossing the Nyquist limit defined as the inverse of the double size of the object under study.

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