Secondary electron emission induced by impact of low-velocity molecular ions on a microchannel plate

Author(s):  
P.W. Geno ◽  
R.D. Macfarlane

The importance of secondary electron emission in its relation to the excitation of soft X-rays has been pointed out in a recent paper by Prof. O. W. Richardson. He has shown that at every potential where there is an increased excitation of soft X-rays, there is correspondingly an increase in the emission of secondary electrons, and has discussed at some length the mechanism of the generation of secondary electrons. It was therefore felt that a much clearer idea of the phenomenon of soft X-ray excitation from metallic surfaces could be had by studying the secondary electron emission from polycrystalline and single crystal faces. As early as in 1908 Richardson showed that slowly moving electrons are reflected in considerable proportion from metallic plates. Davisson and Kunsman, in a series of papers commencing from 1921, showed that at low voltages up to about 9 volts most of the secondary electrons were purely reflected electrons with velocities the same as the incident electrons. The percentage of the reflected electrons fell rapidly as the applied potential was increased above 9 volts, while that of low velocity electrons increased steadily. Farnsworth, with improved apparatus, added much valuable information regarding the generation of secondary electrons and the conditions operating in such cases. These observers showed that the total emission of secondary electrons from a metal surface depended on the applied potential, the nature of the surface and the previous heat treatment of the metal. They also found that the ratio of the secondary beam to the primary increases with applied potential and becomes greater than 1 after a certain potential, depending on the nature of the bombarded metal, is reached.


The electron emission from a number of metal and carbon targets bombarded by various positive ions is measured by a method employing a magnetic field to separate secondary electrons from scattered ions. Molecular ions are shown to produce emission approximately equal to that which would be produced by the individual atoms independently. Accurate measurements have been made of the energy distribution of secondary electrons. These are close to Gaussian. It is concluded that secondary electron emission is confined to the surface layers of the target atoms since no electrons possess energies close to zero.


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