Application of a large area ion doping technique to a-Si:H TFT for LCD

Author(s):  
Akihisa Yoshida ◽  
Masatoshi Kitagawa ◽  
Takashi Hirao
1994 ◽  
Vol 345 ◽  
Author(s):  
Nobuki Ibaraki

AbstractA technical trend for a-Si TFTs is their application to large-size, high-pixel density AMLCDs such as XGA, EWS, and HDTV. In order to realize these LCDs, the TFT device characteristics must be improved. Future technologies, which will be necessary to fabricate TFTs with improved characteristics are as follows,(1) Fully self-aligned TFT technology: A SA-TFT structure reduces the feedthrough voltage caused by parasitic capacitance due to gate/source overlap. This results in an improved picture quality and a higher aperture ratio. Fabrication of such a structure would require ion doping technology.(2) Ion doping technology: This non-mass-separated implantation technique has large area doping capability and much higher doping speed compared to conventional ion implantation technique. The major problems with the ion doping technique is the implantation of unwanted species which deteriorate the quality of source/drain and channel regions of TFTs.


Author(s):  
Akihisa Yoshida ◽  
Masatoshi Kitagawa ◽  
Takashi Hirao

Author(s):  
Takashi Hirao ◽  
Akihisa Yoshida ◽  
Masatoshi Kitagawa

1988 ◽  
Author(s):  
Akihisa YOSHIDA ◽  
Masatoshi KITAGAWA ◽  
Kentaro SETSUNE ◽  
Takashi HIRAO

1990 ◽  
Vol 137 (11) ◽  
pp. 3522-3526 ◽  
Author(s):  
G. Kawachi ◽  
T. Aoyama ◽  
K. Miyata ◽  
Y. Ohno ◽  
A. Mimura ◽  
...  

1990 ◽  
Author(s):  
Akihisa YOSHIDA ◽  
Masaaki NUKAYAMA ◽  
Yasunori ANDOH ◽  
Masatoshi KITAGAWA ◽  
Takashi HIRAO

1994 ◽  
Vol 336 ◽  
Author(s):  
Nobuki Ibaraki

ABSTRACTA technical trend for a-Si TFTs is their application to large-size, high-pixel density AM-LCDs such as XGA, EWS, and HDTV. In order to realize these LCDs, the TFT device characteristics must be improved. Future technologies, which will be necessary to fabricate TFTs with improved characteristics are as follows(1) Fully self-aligned TFT technology: A SA-TFT structure reduces the feedthrough voltage caused by parasitic capacitance due to gate/source overlap. This results in an improved picture quality and a higher aperture ratio. Fabrication of such a structure would require ion doping technology.(2) Ion doping technology: This non-Mass-separated implantation technique has large area doping capability and much higher doping speed compared to conventional ion implantation technique. The Major problems with the ion doping technique is the implantation of unwanted species which deteriorate the quality of source/drain and channel regions of TFTs.


1991 ◽  
Vol 30 (Part 2, No. 1A) ◽  
pp. L67-L69 ◽  
Author(s):  
Akihisa Yoshida ◽  
Masaaki Nukayama ◽  
Yasunori Andoh ◽  
Masatoshi Kitagawa ◽  
Takashi Hirao

2012 ◽  
Vol 1407 ◽  
Author(s):  
Tianhua Yu ◽  
Edwin Kim ◽  
Nikhil Jain ◽  
Bin Yu

ABSTRACT3D stacked (or uncorrelated) multilayer graphene (s-MLG) is investigated as a potential material platform for carbon-based on-chip interconnects. S-MLG samples are prepared by repeatedly transferring and stacking the large-area CVD-grown graphene monolayers, followed by wire patterning and oxygen plasma etching of graphene. We observed superior wire conduction of s-MLG over that of monolayer graphene or ABAB-stacked multilayer graphene. Further reduction of s-MLG resistivity is anticipated with increasing number of stacked layers. Electrical stress-induced doping technique is used to engineer the Dirac point, as well as to reduce graphene-to-metal contact resistance, improving the overall performance metrics of the s-MLG system. Breakdown experiments show that the current-carrying capacity of s-MLG is significantly enhanced as compared with that of monolayer graphene.


1990 ◽  
Author(s):  
Masatoshi Kitagawa ◽  
Shigenori Hayashi ◽  
Takeshi Kamada ◽  
Tomiyo Yoshida ◽  
Akihisa Yoshida ◽  
...  

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