Depth profiling of high-fluence O- and Cl-implanted YBa2Cu3O7−δ films by photoemission spectroscopy
1993 ◽
Vol 73
(2)
◽
pp. 191-198
1996 ◽
Vol 114
(3-4)
◽
pp. 269-275
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Keyword(s):
2018 ◽
Vol 115
(31)
◽
pp. 7896-7900
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1988 ◽
Vol 33
(1-4)
◽
pp. 780-783
◽
1981 ◽
Vol 39
◽
pp. 16-17