Atomic force microscopy (AFM) morphological surface characterization of transparent gas barrier coatings on plastic films

Surface and Coatings Technology ◽

10.1016/0257-8972(95)02712-2 ◽

1996 ◽

Vol 80 (1-2) ◽

pp. 203-206 ◽

Author(s):

G. Garcia-Ayuso ◽

L. Vázquez ◽

J.M. Martínez-Duart

Keyword(s):

Atomic Force Microscopy ◽

Surface Characterization ◽

Gas Barrier ◽

Barrier Coatings ◽

Plastic Films ◽

Force Microscopy ◽

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Surface characterization of microstructures on glass by atomic force microscopy and analytical scanning electron microscopy

Defect Recognition and Image Processing in Semiconductors 1997 ◽

10.1201/9781315140810-45 ◽

2017 ◽

pp. 221-224

Author(s):

T. Boeck ◽

K. Schmidt ◽

A. Gerlitzke ◽

P.-M. Wilde

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Analytical Scanning Electron Microscopy ◽

Scanning Electron

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Atomic force microscopy as a suitable technique for surface characterization of activated composite membranes for metal ion facilitated transport

Applied Physics A ◽

10.1007/s00339-006-3609-x ◽

2006 ◽

Vol 84 (3) ◽

pp. 277-284 ◽

Author(s):

J. Macanás ◽

L. Palacio ◽

P. Prádanos ◽

A. Hernández ◽

M. Muñoz

Keyword(s):

Atomic Force Microscopy ◽

Metal Ion ◽

Surface Characterization ◽

Composite Membranes ◽

Facilitated Transport ◽

Force Microscopy ◽

Atomic Force ◽

Suitable Technique

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Surface Characterization of Plasma-treated Eucalyptus Alkaline Peroxide Mechanical Pulp using Electronic Spectroscopy Chemical Analysis and Atomic Force Microscopy

BioResources ◽

10.15376/biores.13.2.3500-3510 ◽

2018 ◽

Vol 13 (2) ◽

Author(s):

Chongxing Huang ◽

Yuan Zhao ◽

Ying Liu ◽

Yizhao Chen ◽

Cuicui Li ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Chemical Analysis ◽

Surface Characterization ◽

Electronic Spectroscopy ◽

Mechanical Pulp ◽

Force Microscopy ◽

Alkaline Peroxide ◽

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Surface characterization of human hair by atomic force microscopy in the imaging and F-d modes

International Journal of Cosmetic Science ◽

10.1046/j.1467-2494.2001.00080.x ◽

2001 ◽

Vol 23 (3) ◽

pp. 165-174 ◽

Author(s):

J. Blach ◽

W. Loughlin ◽

G. Watson ◽

S. Myhra

Keyword(s):

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

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Surface Characterization of Fe-Ag Thin Films by Atomic Force Microscopy

Journal of Metastable and Nanocrystalline Materials ◽

10.4028/www.scientific.net/jmnm.20-21.611 ◽

2004 ◽

Vol 20-21 ◽

pp. 611-616

Author(s):

José M. Barandiarán ◽

Iñaki Orue ◽

M.L. Fdez-Gubieda ◽

A. García Prieto

Keyword(s):

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

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Surface Characterization of Collagen Films by Atomic Force Microscopy

XII Mediterranean Conference on Medical and Biological Engineering and Computing 2010 - IFMBE Proceedings ◽

10.1007/978-3-642-13039-7_154 ◽

2010 ◽

pp. 612-615 ◽

Author(s):

A. Stylianou ◽

S. B. Kontomaris ◽

M. Kyriazi ◽

D. Yova

Keyword(s):

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

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Comment on “Surface Characterization of Hydrosilylated Polypropylene: Contact Angle Measurement and Atomic Force Microscopy”

Langmuir ◽

10.1021/la035736z ◽

2003 ◽

Vol 19 (24) ◽

pp. 10457-10458 ◽

Author(s):

Junfeng Zhang ◽

Karina Grundke ◽

Daniel Y. Kwok

Keyword(s):

Contact Angle ◽

Atomic Force Microscopy ◽

Surface Characterization ◽

Contact Angle Measurement ◽

Angle Measurement ◽

Force Microscopy ◽

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Atomic force microscopy used for the surface characterization of microcapsule immunoisolation devices

Journal of Biomedical Materials Research ◽

10.1002/(sici)1097-4636(19980905)41:3<461::aid-jbm16>3.0.co;2-l ◽

1998 ◽

Vol 41 (3) ◽

pp. 461-467 ◽

Author(s):

Keyang Xu ◽

David M. Hercules ◽

Igor Lacik ◽

Taylor G. Wang

Keyword(s):

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

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Bulk and surface characterization of composite UF membranes Atomic force microscopy, gas adsorption-desorption and liquid displacement techniques

Journal of Membrane Science ◽

10.1016/s0376-7388(96)00304-3 ◽

1997 ◽

Vol 128 (1) ◽

pp. 7-21 ◽

Author(s):

J.I. Calvo ◽

P. Prádanos ◽

A. Hernández ◽

W.Richard Bowen ◽

Nidal Hilal ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Surface Characterization ◽

Gas Adsorption ◽

Force Microscopy ◽

Atomic Force ◽

Uf Membranes ◽

Liquid Displacement ◽

Adsorption Desorption

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Surface Characterization of Materials at Ambient Conditions by Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM)

Applied Spectroscopy Reviews ◽

10.1080/05704929308021499 ◽

1993 ◽

Vol 28 (1-2) ◽

pp. 1-121 ◽

Author(s):

Sergei N. Magonov

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Surface Characterization ◽

Scanning Tunneling ◽

Ambient Conditions ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Characterization Of Materials

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