scholarly journals The effect of amorphous surface layers on images of crystals in high resolution transmission electron microscopy

1985 ◽  
Vol 16 (2) ◽  
pp. 193-201 ◽  
Author(s):  
R. Kilaas ◽  
R. Gronsky
Author(s):  
William Krakow

In nonprimitive lattices, surface layers corresponding to partially filled unit cells give rise to reflections forbidden in the bulk structure. These reflections allow detailed studies of the surface layer by high resolution transmission electron microscopy and computer modeling experiments.The occurrence of fractional unit cells at the surface of (001) oriented Au films can be demonstrated by assembling the fcc lattice by the alternate stacking of planar {100} type layers such that the atoms of,each atomic layer are embedded in the depressions of neighboring planes above and below. The stacking sequence is of the ABABAB….type with the B layers shifted an amount ao/2 in the [100] direction (Fig. 1a). The presence of an excess A or B layer gives rise to additional reflections with mixed odd and even Miller indices which are forbidden in the fcc lattice, e.g., (110). In obtaining diffraction patterns from ∼100Å thick Au films the forbidden reflections were approximately 2% of the corresponding bulk lattice reflections and easily identified (see Fig. 1b).


Author(s):  
R. Gronsky

The phenomenon of clustering in Al-Ag alloys has been extensively studied since the early work of Guinierl, wherein the pre-precipitation state was characterized as an assembly of spherical, ordered, silver-rich G.P. zones. Subsequent x-ray and TEM investigations yielded results in general agreement with this model. However, serious discrepancies were later revealed by the detailed x-ray diffraction - based computer simulations of Gragg and Cohen, i.e., the silver-rich clusters were instead octahedral in shape and fully disordered, atleast below 170°C. The object of the present investigation is to examine directly the structural characteristics of G.P. zones in Al-Ag by high resolution transmission electron microscopy.


Carbon ◽  
2017 ◽  
Vol 117 ◽  
pp. 174-181 ◽  
Author(s):  
Chang’an Wang ◽  
Thomas Huddle ◽  
Chung-Hsuan Huang ◽  
Wenbo Zhu ◽  
Randy L. Vander Wal ◽  
...  

2016 ◽  
Vol 30 (20) ◽  
pp. 1650269 ◽  
Author(s):  
Thi Giang Le ◽  
Minh Tuan Dau

High-resolution transmission electron microscopy (HR-TEM) has been used to investigate the structural properties of GeMn/Ge nanocolumns multilayer samples grown on Ge(001) substrates by means of molecular beam epitaxy (MBE) system. Four bilayers with the spacer thickness in the range between 6 nm and 15 nm and 10 periods of bilayers of Ge[Formula: see text]Mn[Formula: see text]/Ge nanocolumn are presented. A simplified 2D model based on the theory of elastic constant interactions has been used to provide reasonable explanations to the vertical self-organization of GeMn nanocolumns in multilayers.


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