Approximate stochastic equation for reduced distribution function as applied to nucleation in critical fluid

1975 ◽  
Vol 53 (2) ◽  
pp. 117-118 ◽  
Author(s):  
K. Kawasaki
2006 ◽  
Vol 2006 (suppl_23_2006) ◽  
pp. 175-180
Author(s):  
G. Gómez-Gasga ◽  
T. Kryshtab ◽  
J. Palacios-Gómez ◽  
A. de Ita de la Torre

2002 ◽  
Vol 7 (1) ◽  
pp. 55-60 ◽  
Author(s):  
Antanas Karoblis

The exponential distribution and the Erlang distribution function are been used in numerous areas of mathematics, and specifically in the queueing theory. Such and similar applications emphasize the importance of estimation of error of approximation by the Erlang distribution function. The article gives an analysis and technique of error’s estimation of an accuracy of such approximation, especially in some specific cases.


1997 ◽  
Vol 473 ◽  
Author(s):  
H. S. Yang ◽  
F. R. Brotzen ◽  
D. L. Callahan ◽  
C. F. Dunn

ABSTRACTQuantitative measurement of the adhesion strength of thin film metallizations has been achieved by a novel technique employing electrostatic forces to generate delaminating stresses. This technique has been used in testing the adhesion of Al-Cu, Cu, and Al multilayer films deposited on Si. Micro-blister-type failure is revealed by scanning electron microscopy. The delamination process and the geometry of the blister are discussed. The measured adhesion data fit a Weibull distribution function.


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