Ion scattering spectrometry and secondary ion mass spectrometry in the surface characterization of smut on stainless steel

Ion Scattering ◽

Ion Mass Spectrometry ◽

Characterization of S-glass/polysulfone adhesive failure using ion scattering spectroscopy and secondary ion mass spectrometry

Journal of Colloid and Interface Science ◽

10.1016/0021-9797(80)90178-2 ◽

1980 ◽

Vol 74 (1) ◽

pp. 150-162 ◽

Cited By ~ 26

Author(s):

Anthony T Dibenedetto ◽

Daniel A Scola

Keyword(s):

Mass Spectrometry ◽

Adhesive Failure ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

Surface characterization of 2-hydroxyethyl methacrylate/styrene copolymers by angle-dependent X-ray photoelectron spectroscopy and static secondary ion mass spectrometry

Journal of Biomaterials Science Polymer Edition ◽

10.1163/156856292x00448 ◽

1992 ◽

Vol 3 (6) ◽

pp. 463-480 ◽

Cited By ~ 14

Author(s):

D.G. Castner ◽

B.D. Ratner ◽

D.W. Grainger ◽

S.W. Kim ◽

T. Okano ◽

...

Keyword(s):

Mass Spectrometry ◽

Hydroxyethyl Methacrylate ◽

X Ray ◽

Styrene Copolymers ◽

Ion Mass Spectrometry ◽

Surface characterization of polymers: Complementary information from x‐ray photoelectron spectroscopy and static secondary ion mass spectrometry

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.577642 ◽

1991 ◽

Vol 9 (3) ◽

pp. 1441-1446 ◽

Cited By ~ 10

Author(s):

W. F. Stickle ◽

J. F. Moulder

Keyword(s):

Mass Spectrometry ◽

Complementary Information ◽

X Ray ◽

Ion Mass Spectrometry ◽

APPLICATIONS OF X-RAY PHOTOELECTRON SPECTROSCOPY AND STATIC SECONDARY ION MASS SPECTROMETRY IN SURFACE CHARACTERIZATION OF COPOLYMERS AND POLYMERS BLENDS

Reviews in Chemical Engineering ◽

10.1515/revce.2000.16.4.341 ◽

2000 ◽

Vol 16 (4) ◽

Cited By ~ 24

Author(s):

Chi-Ming Chan ◽

Lu-Tao Weng

Keyword(s):

Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

Time-of-flight secondary ion mass spectrometry as a novel method for surface characterization of carbonaceous material formed during thermochemical conversion of cellulose

International Journal of Mass Spectrometry ◽

10.1016/j.ijms.2012.11.008 ◽

2013 ◽

Vol 336 ◽

pp. 43-46 ◽

Cited By ~ 4

Author(s):

Jacek Grams ◽

Agnieszka M. Ruppert ◽

Michał Niewiadomski ◽

Marcin Jędrzejczyk

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Carbonaceous Material ◽

Thermochemical Conversion ◽

Ion Mass Spectrometry ◽

Novel Method ◽

Time-of-flight secondary-ion mass spectrometry for the surface characterization of solid-state pharmaceuticals

Journal of Pharmacy and Pharmacology ◽

10.1211/jpp.59.2.0011 ◽

2007 ◽

Vol 59 (2) ◽

pp. 251-259 ◽

Cited By ~ 15

Author(s):

Clive A. Prestidge ◽

Timothy J. Barnes ◽

William Skinner

Keyword(s):

Mass Spectrometry ◽

Solid State ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Surface characterization of a poly(styrene/p‐hydroxystyrene) copolymer series using x‐ray photoelectron spectroscopy, static secondary ion mass spectrometry, and chemical derivatization techniques

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.576750 ◽

1990 ◽

Vol 8 (3) ◽

pp. 2274-2282 ◽

Cited By ~ 38

Author(s):

Ashutosh Chilkoti ◽

David G. Castner ◽

Buddy D. Ratner ◽

David Briggs

Keyword(s):

Mass Spectrometry ◽

Chemical Derivatization ◽

X Ray ◽

Ion Mass Spectrometry ◽

Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries

ACS Applied Materials & Interfaces ◽

10.1021/acsami.1c10352 ◽

2021 ◽

Vol 13 (34) ◽

pp. 41262-41274

Author(s):

Agnieszka Priebe ◽

Jordi Sastre ◽

Moritz H. Futscher ◽

Jakub Jurczyk ◽

Marcos V. Puydinger dos Santos ◽

...

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Elemental Characterization

Analysis of SnNi Electroplate by Secondary Ion Mass Spectrometry, Ion Scattering Spectrometry, and Rutherford Backscattering

Journal of The Electrochemical Society ◽

10.1149/1.2131652 ◽

1978 ◽

Vol 125 (8) ◽

pp. 1215-1218 ◽

Cited By ~ 6

Author(s):

Rudolf Schubert

Keyword(s):

Mass Spectrometry ◽

Rutherford Backscattering ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

Direct Surface Analysis of Pesticides on Soil, Leaves, Grass, and Stainless Steel by Static Secondary Ion Mass Spectrometry

Environmental Science & Technology ◽

10.1021/es960213h ◽

1997 ◽

Vol 31 (2) ◽

pp. 402-408 ◽

Cited By ~ 24

Author(s):

Jani C. Ingram ◽

Gary S. Groenewold ◽

Anthony D. Appelhans ◽

James E. Delmore ◽

John E. Olson ◽

...

Keyword(s):

Mass Spectrometry ◽

Stainless Steel ◽

Surface Analysis ◽

Ion Mass Spectrometry ◽