Characterization of S-glass/polysulfone adhesive failure using ion scattering spectroscopy and secondary ion mass spectrometry

Journal of Colloid and Interface Science ◽

10.1016/0021-9797(80)90178-2 ◽

1980 ◽

Vol 74 (1) ◽

pp. 150-162 ◽

Author(s):

Anthony T Dibenedetto ◽

Daniel A Scola

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Adhesive Failure ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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SURFACE ANALYSIS OF POLYSTYRENE LATEXES BY ION SCATTERING SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY

Journal of Dispersion Science and Technology ◽

10.1080/01932698108943913 ◽

1981 ◽

Vol 2 (2-3) ◽

pp. 267-280 ◽

Author(s):

Charles C. Fifield ◽

Robert M. Fitch

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Ion scattering spectrometry and secondary ion mass spectrometry in the surface characterization of smut on stainless steel

Surface Technology ◽

10.1016/0376-4583(80)90099-0 ◽

1980 ◽

Vol 11 (6) ◽

pp. 385-391 ◽

Author(s):

W.L. Baun

Keyword(s):

Mass Spectrometry ◽

Stainless Steel ◽

Surface Characterization ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

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7676. An situ study of the reactive ion beam etching of tungsten with tetrafluoremethane/argon mixtures using ion scattering spectroscopy and secondary ion mass spectrometry

Vacuum ◽

10.1016/0042-207x(91)91744-9 ◽

1991 ◽

Vol 42 (10-11) ◽

pp. 694

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Ion Scattering ◽

Ion Beam Etching ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Reactive Ion Beam Etching

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Surface analysis of etched Magnox alloys by secondary ion mass spectrometry and ion scattering spectroscopy

Metal Science ◽

10.1179/030634584790419980 ◽

1984 ◽

Vol 18 (6) ◽

pp. 295-298 ◽

Author(s):

G. C. Allen

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Ion scattering spectroscopy and secondary ion mass spectrometry (ISS/SIMS) studies of zeolites

Journal of Catalysis ◽

10.1016/0021-9517(83)90012-x ◽

1983 ◽

Vol 84 (2) ◽

pp. 410-422 ◽

Author(s):

S SUIB

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Use of Ion Scattering and Secondary Ion Mass Spectrometry to Characterize Apparent “Adhesive” Failure in an Adhesive Bond

The Journal of Adhesion ◽

10.1080/00218467608075057 ◽

1976 ◽

Vol 7 (4) ◽

pp. 261-267 ◽

Author(s):

W. L. Baun

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Adhesive Bond ◽

Adhesive Failure ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

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Sputtering of chlorinated silicon surfaces studied by secondary ion mass spectrometry and ion scattering spectroscopy

Journal of Applied Physics ◽

10.1063/1.334536 ◽

1985 ◽

Vol 57 (4) ◽

pp. 1336-1342 ◽

Author(s):

E. L. Barish ◽

D. J. Vitkavage ◽

T. M. Mayer

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Silicon Surfaces ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Comparison of static secondary ion mass spectrometry, ion scattering spectroscopy, and x-ray photoelectron spectroscopy for surface analysis of acrylic polymers

Analytical Chemistry ◽

10.1021/ac00235a037 ◽

1981 ◽

Vol 53 (12) ◽

pp. 1879-1884 ◽

Author(s):

Joseph A. Gardella ◽

David M. Hercules

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Acrylic Polymers ◽

X Ray ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries

ACS Applied Materials & Interfaces ◽

10.1021/acsami.1c10352 ◽

2021 ◽

Vol 13 (34) ◽

pp. 41262-41274

Author(s):

Agnieszka Priebe ◽

Jordi Sastre ◽

Moritz H. Futscher ◽

Jakub Jurczyk ◽

Marcos V. Puydinger dos Santos ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Elemental Characterization

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Analysis of SnNi Electroplate by Secondary Ion Mass Spectrometry, Ion Scattering Spectrometry, and Rutherford Backscattering

Journal of The Electrochemical Society ◽

10.1149/1.2131652 ◽

1978 ◽

Vol 125 (8) ◽

pp. 1215-1218 ◽

Author(s):

Rudolf Schubert

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Rutherford Backscattering ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

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