The effect of X-ray penetration depth on structural characterization of multiphase Bi-Sr-Ca-Cu-O thin films by X-ray diffraction techniques

1991 ◽  
Vol 173 (3-4) ◽  
pp. 152-158 ◽  
Author(s):  
T.N. Blanton ◽  
C.L. Barnes ◽  
M. Lelental
Keyword(s):  
Thin Films ◽  
Penetration Depth ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray

Growth and structural characterization of Cu2ZnSnSe4 compound for solar cells

2014 ◽  
Vol 92 (7/8) ◽  
pp. 902-904 ◽  
Author(s):  
N. Seña ◽  
F. Mesa ◽  
A. Dussan ◽  
G. Gordillo
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
Deposition Temperature ◽  
Mass Ratio ◽  
Electrical Behavior ◽  
X Ray Diffraction ◽  
X Ray ◽  
Deposition Parameters ◽  
Stage Process

This work reports results concerning the effect of the deposition parameters on the structural properties of Cu2ZnSnSe4 thin films, grown through a chemical reaction of the metallic precursors via coevaporation in a three-stage process. X-ray diffraction measurements revealed that the samples deposited by selenization of Cu and Sn grow in the Cu2Se and SnSe2 phases, respectively. The effect of deposition temperature and Cu/Se mass ratio on the transport properties of Cu2ZnSnSe4 films was analyzed. The electrical behavior of the compound was studied.

Structural characterization of the temperature dependence of C60‐thin films on mica (001) by x‐ray diffraction

1994 ◽  
Vol 76 (6) ◽  
pp. 3337-3340 ◽  
Author(s):  
S. Henke ◽  
K. H. Thürer ◽  
J. K. N. Lindner ◽  
B. Rauschenbach ◽  
B. Stritzker
Keyword(s):  
Thin Films ◽  
Temperature Dependence ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray

Structural characterization of cadmium selenide thin films by X-ray diffraction and electron microscopy

1992 ◽  
Vol 25 (10) ◽  
pp. 1488-1494 ◽  
Author(s):  
U Pal ◽  
D Samanta ◽  
S Ghorai ◽  
B K Samantaray ◽  
A K Chaudhuri
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Cadmium Selenide ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray

Structural characterization of strained (Ba0.5,Sr0.5)TiO3 thin films grown on Si by synchrotron X-ray diffraction

2001 ◽  
Vol 38 (1-4) ◽  
pp. 201-210
Author(s):  
Sungjin Jun ◽  
Sangsub Kim ◽  
Jungho Je ◽  
Jaichan Lee
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray
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