Structural characterization of cadmium selenide thin films by X-ray diffraction and electron microscopy

Al-Cu-Fe quasicrystals powder was used to prepare the thin films on the surface of the A3 steel by the means of DMD-450 vacuum evaporation equipment. The thin films with different characterization were obtained through different parameters. The microstructures of the thin films were analyzed by Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD). Additionally, the nano-hardness and the modulus of the films are tested by MTS and Neophot micro-hardness meter. The results showed that the modulus of the films was about 160GPa. Nano hardness of the films was about 7.5 Gpa. The films consisted of CuAl2, AlCu3. The thickness and the micro-hardness of the films are improved. In same way, with the increase of the electric current, the thickness and the hardness of the films are also improved. Along with increase of the time and the electric current, the wear behavior of the films was improved. To some extent, the microstructure of films contained the quasicrystal phase of Al65Cu20Fe15.

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Microstructure Characterization of Si/C Multilayer Thin Films

Materials Science Forum ◽

10.4028/www.scientific.net/msf.743-744.910 ◽

2013 ◽

Vol 743-744 ◽

pp. 910-914

Author(s):

Ting Han ◽

Geng Rong Chang ◽

Yun Jin Sun ◽

Fei Ma ◽

Ke Wei Xu

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

Multilayer Thin Films ◽

X Ray Diffraction ◽

X Ray ◽

Post Annealing ◽

Transmission Electron ◽

Twin Defects ◽

Modulation Ratio

Si/C multilayer thin films were prepared by magnetron sputtering and post-annealing in N2 atmosphere at 1100 for 1h. X-ray diffraction (XRD), Raman scattering and high-resolution transmission electron microscopy (HRTEM) were applied to study the microstructures of the thin films. For the case of Si/C modulation ratio smaller than 1,interlayer diffusion is evident, which promotes the formation of α-SiC during thermal annealing. If the modulation ratio is larger than 1, the Si sublayers are partially crystallized, and the thicker the Si sublayers are, the crystallinity increases. To be excited, brick-shaped nc-Si is directly observed by HRTEM. The brick-shaped nc-Si appears to be more regular near the Si (100) substrate but with twin defects. The results are instructive in the application of solar cells.

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Characterization of r.f.-sputtered ZnO thin films by X-ray diffraction and scanning electron microscopy

Thin Solid Films ◽

10.1016/0040-6090(82)90024-4 ◽

1982 ◽

Vol 94 (1) ◽

pp. 7-14 ◽

Cited By ~ 17

Author(s):

S. Sen ◽

D.J. Leary ◽

C.L. Bauer

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

Scanning Electron Microscopy ◽

Zno Thin Films ◽

X Ray Diffraction ◽

X Ray ◽

Scanning Electron

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Preparation and characterization of Bi2S3-PbS thin films by X-ray diffraction, scanning electron microscopy and resistivity studies

Thin Solid Films ◽

10.1016/0040-6090(94)06266-n ◽

1995 ◽

Vol 254 (1-2) ◽

pp. 47-53 ◽

Cited By ~ 13

Author(s):

Nilima Parhi ◽

B.B. Nayak ◽

B.S. Acharya

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

Scanning Electron Microscopy ◽

X Ray Diffraction ◽

X Ray ◽

Scanning Electron

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Growth and Characterization of Lithium Niobate Thin Films on Diamond/Si(100) Substrates

MRS Proceedings ◽

10.1557/proc-541-717 ◽

1998 ◽

Vol 541 ◽

Cited By ~ 4

Author(s):

Shunxi Wang ◽

Qingxin Su ◽

Marc A. Robert ◽

Thomas A. Rabson

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

Scanning Electron Microscopy ◽

Smooth Surface ◽

X Ray Diffraction ◽

X Ray ◽

Metal Organic ◽

Scanning Electron ◽

Organic Decomposition

AbstractA low temperature metal-organic decomposition process for depositing LiNbO3 thin films on diamond/Si(100) substrates is reported. X-ray diffraction studies show that the films are highly textured polycrystalline LiNbO3 with a (012) orientation. Scanning electron microscopy analyses reveal that the LiNbO3 thin films have dense, smooth surface without cracks and pores, and adhere very well to the diamond substrates. The grain size in the LiNbO3 thin films is in the range of ∼0.2-0.5 μm. The effect of the processing procedures on the surface morphology of the LiNbO3 films is investigated. Possible reasons for the elimination of microcracks in the LiNbO3 films are discussed.

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Structural Characterization of Thin Films by X-Ray Diffraction and Reflectivity

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-5377-9_67 ◽

1997 ◽

pp. 615-625

Author(s):

Daniel T. Brower ◽

Brian S. Medower ◽

Ting C. Huang

Keyword(s):

Thin Films ◽

Structural Characterization ◽

X Ray Diffraction ◽

X Ray

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Structural characterization of Al 0.55 Ga 0.45 N epitaxial layer determined by high resolution x-ray diffraction and transmission electron microscopy

Chinese Physics B ◽

10.1088/1674-1056/26/4/047801 ◽

2017 ◽

Vol 26 (4) ◽

pp. 047801 ◽

Cited By ~ 1

Author(s):

Qing-Jun Xu ◽

Bin Liu ◽

Shi-Ying Zhang ◽

Tao Tao ◽

Zi-Li Xie ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Epitaxial Layer ◽

Structural Characterization ◽

X Ray Diffraction ◽

X Ray ◽

Transmission Electron

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Growth and structural characterization of Cu2ZnSnSe4 compound for solar cells

Canadian Journal of Physics ◽

10.1139/cjp-2013-0602 ◽

2014 ◽

Vol 92 (7/8) ◽

pp. 902-904 ◽

Cited By ~ 1

Author(s):

N. Seña ◽

F. Mesa ◽

A. Dussan ◽

G. Gordillo

Keyword(s):

Thin Films ◽

Structural Characterization ◽

Deposition Temperature ◽

Mass Ratio ◽

Electrical Behavior ◽

X Ray Diffraction ◽

X Ray ◽

Deposition Parameters ◽

Stage Process

This work reports results concerning the effect of the deposition parameters on the structural properties of Cu2ZnSnSe4 thin films, grown through a chemical reaction of the metallic precursors via coevaporation in a three-stage process. X-ray diffraction measurements revealed that the samples deposited by selenization of Cu and Sn grow in the Cu2Se and SnSe2 phases, respectively. The effect of deposition temperature and Cu/Se mass ratio on the transport properties of Cu2ZnSnSe4 films was analyzed. The electrical behavior of the compound was studied.

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