Optical constants of YBaCuO from polarized reflectance measurements

1994 ◽  
Vol 223 (1-2) ◽  
pp. 117-122 ◽  
Author(s):  
W. Markowitsch ◽  
W. Mayr ◽  
P. Schwab ◽  
X.Z. Wang
Keyword(s):  
Optical Constants ◽  
Reflectance Measurements ◽  
Polarized Reflectance

Calculation of Spectral Optical Constants Using Combined Ellipsometric and Reflectance Methods for Smooth and Rough Bulk Samples

2021 ◽  
pp. 000370282110478
Author(s):  
Gilles Fortin
Keyword(s):  
Rough Surface ◽  
Optical Constants ◽  
Sample Surface ◽  
Infrared Region ◽  
Homogeneous Sample ◽  
Specular Reflectance ◽  
Scattering Effects ◽  
Spectral Ranges ◽  
Reflectance Measurements ◽  
Polarized Reflectance

Spectra of the optical constants n and k of a substance are often deduced from spectroscopic measurements, performed on a thick and homogeneous sample, and from a model used to simulate these measurements. Spectra obtained for n and k using the ellipsometric method generally produce polarized reflectance simulations in strong agreement with the experimental measurements, but they sometimes introduce significant discrepancies over limited spectral ranges, whereas spectra of n and k obtained with the single-angle reflectance method require a perfectly smooth sample surface to be viable. This paper presents an alternative method to calculate n and k. The method exploits both ellipsometric measurements and s-polarized specular reflectance measurements, and compensates for potential surface scattering effects with the introduction of a specularity factor. It is applicable to bulk samples having either a smooth or a rough surface. It provides spectral optical constants that are consistent with s-polarized reflectance measurements. Demonstrations are performed in the infrared region using a glass slide (smooth surface) and a pellet of compressed ammonium sulfate powder (rough surface).

Optical constants of particulate minerals from reflectance measurements: The case of calcite

2006 ◽  
Vol 100 (1-3) ◽  
pp. 250-255 ◽  
Author(s):  
A.C. Marra ◽  
R. Politi ◽  
A. Blanco ◽  
R. Brunetto ◽  
S. Fonti ◽  
...  
Keyword(s):  
Optical Constants ◽  
Reflectance Measurements

Optical constants of silicon and silicon dioxide using soft X-ray reflectance measurements

2002 ◽  
Vol 211 (1-6) ◽  
pp. 215-223 ◽  
Author(s):  
Pragya Tripathi ◽  
G.S. Lodha ◽  
M.H. Modi ◽  
A.K. Sinha ◽  
K.J.S. Sawhney ◽  
...  
Keyword(s):  
Silicon Dioxide ◽  
Optical Constants ◽  
X Ray ◽  
Reflectance Measurements

Optical Indices of Pyrolytic Tin-Oxide Glass

1996 ◽  
Vol 426 ◽  
Author(s):  
K. Von Rottkay ◽  
M. Rubin
Keyword(s):  
Optical Constants ◽  
Complex Structure ◽  
Optical Design ◽  
Solar Spectrum ◽  
Oxide Glass ◽  
Transparent Conductor ◽  
Force Microscopy ◽  
Atomic Force ◽  
Glass Current ◽  
Reflectance Measurements

AbstractSnO2:F is a widely used transparent conductor and commercially available in a multilayer structure as Tech glass. Current applications include photovoltaics, electrochromics and displays. Optical design of these and other applications requires knowledge of the optical constants, in some cases, over the whole solar spectrum. Various optical property measurements were performed including variable angle spectroscopic ellipsometry, and spectral transmittance and reflectance measurements. This material is deposited in several steps and has a fairly complex structure. The measured data were fit to models based on this structure to obtain the optical indices. Atomic force microscopy confirmed the optically modeled surface roughness.

scholarly journals Accuracy assessments of cloud droplet size retrievals from polarized reflectance measurements by the research scanning polarimeter

2012 ◽  
Vol 125 ◽  
pp. 92-111 ◽  
Author(s):  
Mikhail D. Alexandrov ◽  
Brian Cairns ◽  
Claudia Emde ◽  
Andrew S. Ackerman ◽  
Bastiaan van Diedenhoven
Keyword(s):  
Droplet Size ◽  
Cloud Droplet ◽  
Accuracy Assessments ◽  
Reflectance Measurements ◽  
Polarized Reflectance
Sign in / Sign up

Export Citation Format

Share Document