Low frequency noise as a characterization tool for InP- and GaAs-based double-barrier resonant tunnelling diodes
1993 ◽
Vol 20
(1-2)
◽
pp. 207-213
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2017 ◽
Vol 17
(10)
◽
pp. 7107-7114
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Keyword(s):
HEMTs for low-power and low-frequency noise 4.2 K cryoelectronics : fabrication and characterization
1998 ◽
Vol 08
(PR3)
◽
pp. Pr3-131-Pr3-134
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Keyword(s):
Keyword(s):
1999 ◽
2002 ◽
Keyword(s):
Keyword(s):
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