Current gain deterioration in carbon-doped AlGaAs/GaAs heterojunction bipolar transistors during high-temperature bias stress tests
1994 ◽
Vol 28
(1-3)
◽
pp. 257-260
◽
Keyword(s):
2006 ◽
Vol 45
(5A)
◽
pp. 3909-3912
◽
Keyword(s):
1993 ◽
Vol 32
(Part 2, No. 3A)
◽
pp. L309-L311
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2005 ◽
Vol 45
(9-11)
◽
pp. 1728-1731
◽
Keyword(s):
2007 ◽
Vol 298
◽
pp. 857-860
◽
Keyword(s):
1994 ◽
Vol 41
(10)
◽
pp. 1698-1707
◽
1997 ◽
Vol 36
(Part 1, No. 3B)
◽
pp. 1866-1868
◽