X-ray flurescence method of surface flaw detection

1991 ◽  
Vol 24 (4) ◽  
pp. 214
Keyword(s):  
2016 ◽  
Vol 7 (3) ◽  
pp. 286-295 ◽  
Author(s):  
А. R. Bаеv ◽  
A. I. Мitkovets ◽  
D. A Коstiuk ◽  
G. E. Konovalov

2021 ◽  
Vol 87 (4) ◽  
pp. 26-31
Author(s):  
A. N. Fokanov ◽  
V. F. Podurazhnaya ◽  
A. V. Tebyakin

Beryllium products exhibiting a low level of absorption of the radiation energy are widely used in scientific instrumentation design (x-ray technology, radiation detectors, etc.). We present the results of studying the leak tightness of products (disks, plates) made of technical sintered beryllium of standard purity and foil obtained by «warm» rolling from high-purity beryllium. The relevant standards and requirements for testing are given. The leak tightness control was performed using mass spectrometric helium leak detectors with forevacuum backing pumps (oil and dry diaphragm pumps) and specialized vacuum equipment. The parameters of tightness of samples made of technical sintered beryllium were determined. The level of the helium signal during blowing was (0.6 – 7.4) × 10–11 Pa · m3/sec, which corresponds to the tightness standard of foreign analogues and matches the requirements of domestic manufacturers of x-ray equipment. The data spread tended to increase due to the growth of the background value. The obtained results can be used to improve high-tech equipment intended for flaw detection, medical devices, rapid analysis of ore raw materials, radiation safety equipment, etc.


2006 ◽  
Vol 73 (3) ◽  
pp. 449-452
Author(s):  
D. S. Anikonov ◽  
I. V. Prokhorov

1984 ◽  
Author(s):  
R. E. Beissner ◽  
G. L. Burkhardt ◽  
F. N. Kusenberger

2020 ◽  
Vol 854 ◽  
pp. 57-63
Author(s):  
Anna V. Rodionova ◽  
Victor I. Kuular ◽  
Tamara S. Minakova ◽  
Parviz Sh. Ustabaev ◽  
Vadim V. Bakhmetyev

Gd2O2S:Tb phosphors with different terbium content are prepared in a reducing atmosphere at various synthesis conditions. The effect of an activator and Na4P2O7 flux concentrations upon photo-and X-ray induced luminescence of the synthesized samples as well as on their acid-base properties and morphology is studied. The addition of Na4P2O7 flux into the charge mixture leads to a significant increase of the phosphor particle size. A positive correlation is found between the particle size and pH value of the phosphor aqueous slurry. The photoluminescence intensity is found to mostly depend on the activator concentration, while X-ray luminescence intensity primarily depends on the particle size and crystal structure perfectness of the phosphor matrix. Charge mixture compositions and synthesis conditions providing Gd2O2S:Tb phosphors with the highest photo-and X-ray luminescence intensity are determined. A Gd2O2S:Tb phosphor with X-ray luminescence intensity exceeding the values for the commercial phosphor KEP-45 of a similar composition is developed. The obtained phosphors can be used for the manufacture of intensifying screens applied in industrial X-ray flaw detection.


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