Scanning tunneling microscopy imaging of grain boundaries and triple junctions in copper

1992 ◽  
Vol 28 (2) ◽  
pp. 133-137 ◽  
Author(s):  
G.D. Bruce ◽  
P. Fortier ◽  
G. Palumbo ◽  
J.E. Guillet ◽  
G.J. Vancso
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Grain Boundaries ◽  
Scanning Tunneling ◽  
Triple Junctions ◽  
Tunneling Microscopy ◽  
Microscopy Imaging

Scanning Tunneling Microscopy Imaging of Defects in Layered Compounds

1990 ◽  
Vol 209 ◽  
Author(s):  
G. P. E. M. Van Bakell ◽  
J. Th. M. De Hosson ◽  
T. Hibma
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Structural Features ◽  
Layered Compounds ◽  
Scanning Tunneling ◽  
X Ray Diffraction ◽  
Tunneling Microscopy ◽  
Microscopy Imaging ◽  
X Ray ◽  
Sample Orientation ◽  
Stm Images

ABSTRACTStructural features of TiS2 were studied by scanning tunneling microscopy (STM) and single-crystal X-ray diffraction was applied as a complementary technique. STM images in air and at room temperature revealed, beside the trigonal symmetry of the lattice, several new features having this symmetry as well. We conclude that these features not only are to be described by structural defect phenomena which affect octahedral sites in the 1T-CdI2 structure but tetrahedral sites as well. Sample orientation determination by X-ray diffraction provides a unique relation between feature types and sites. A model is proposed in which displaced Ti atoms account for the observed features.

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