scholarly journals The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction

2017 ◽  
Vol 126 ◽  
pp. 36-43 ◽  
Author(s):  
C.M. Fancher ◽  
S. Brewer ◽  
C.C. Chung ◽  
S. Röhrig ◽  
T. Rojac ◽  
...  
Keyword(s):  
Dielectric Properties ◽  
Domain Wall ◽  
Wall Motion ◽  
Domain Wall Motion ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Domain and lattice contributions to dielectric and piezoelectric properties of Pb(Zrx, Ti1−x)O3 thin films as a function of composition

1999 ◽  
Vol 14 (11) ◽  
pp. 4307-4318 ◽  
Author(s):  
S. Hiboux ◽  
P. Muralt ◽  
T. Maeder
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Domain Wall ◽  
Diffraction Analysis ◽  
Piezoelectric Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited ◽  
Dielectric And Piezoelectric Properties

In situ reactively sputter deposited, 300-nm-thick Pb(Zrx, Ti1−x)O3 thin films were investigated as a function of composition, texture, and different electrodes (Pt,RuO2).X-ray diffraction analysis, ferroelectric, dielectric, and piezoelectric measurements were carried out. While for dielectric properties bulklike contributions from lattice as well as from domains are observed, domain wall contributions to piezoelectric properties are very much reduced in the morphotropic phase boundary (MPB) region. Permittivity and d33 do not peak at the same composition; the MPB region is broadened up and generally shifted to the tetragonal side.

Observations of Magnetic Domain Structure Change in Nd2Fe14B Magnets at Elevated Temperature with External Magnetic Field by Lorentz Microscopy

2015 ◽  
Vol 1754 ◽  
pp. 31-36 ◽  
Author(s):  
Toshimasa Suzuki ◽  
Koichi Kawahara ◽  
Haruka Tanaka ◽  
Kimihiro Ozaki
Keyword(s):  
Elevated Temperature ◽  
Domain Wall ◽  
Wall Motion ◽  
Magnetic Domain ◽  
Domain Wall Motion ◽  
Magnetic Domain Wall ◽  
Lorentz Microscopy ◽  
Pinning Effect ◽  
In Situ Observations

ABSTRACTIn this study, we conducted the in-situ observations of the magnetic domain structure change in Nd2Fe14B magnets at elevated temperature by transmission electron microscopy (TEM) / Lorentz microscopy. The in-situ observations in Nd2Fe14B magnets revealed that the magnetization reversal easily occurred at the elevated temperature. At more than 180°C, the magnetic domain wall motion could be observed by applying the magnetic field of less than 20 mT. The motion of the magnetic domain wall was discontinuous and the domain wall jumped to one grain boundary to the neighboring grain boundary at 180°C. On the other hand, the continuous domain wall motion within grain interior as well as discontinuous domain wall motion was observed at 225°C, and some grain boundaries showed still strong pinning effect even at 225°C. The temperature dependence of the pinning effect of grain boundaries would not uniform.

In-situ Observation of Domain Wall Motion in Electroplated Ni80-Fe20 Thin Film by Lorentz TEM and DPC Imaging

2017 ◽  
Vol 22 (4) ◽  
pp. 563-569 ◽  
Author(s):  
Su Jin Lee ◽  
Hyo-Jong Lee ◽  
Kyung Song ◽  
Si-Young Choi ◽  
Hyun Soon Park
Keyword(s):  
Thin Film ◽  
Domain Wall ◽  
Wall Motion ◽  
Domain Wall Motion ◽  
In Situ Observation

scholarly journals In situ measurement of increased ferroelectric/ferroelastic domain wall motion in declamped tetragonal lead zirconate titanate thin films

2015 ◽  
Vol 117 (5) ◽  
pp. 054103 ◽  
Author(s):  
M. Wallace ◽  
R. L. Johnson-Wilke ◽  
G. Esteves ◽  
C. M. Fancher ◽  
R. H. T. Wilke ◽  
...  
Keyword(s):  
Thin Films ◽  
Domain Wall ◽  
Lead Zirconate Titanate ◽  
Wall Motion ◽  
Domain Wall Motion ◽  
Lead Zirconate ◽  
In Situ Measurement ◽  
Zirconate Titanate

In-situ observation of domain wall motion in Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 crystals

2014 ◽  
Vol 116 (3) ◽  
pp. 034105 ◽  
Author(s):  
Dabin Lin ◽  
Zhenrong Li ◽  
Fei Li ◽  
Shujun Zhang ◽  
Changlong Cai ◽  
...  
Keyword(s):  
Domain Wall ◽  
Wall Motion ◽  
Domain Wall Motion ◽  
In Situ Observation

New method to measure domain-wall motion contribution to piezoelectricity: the case of PbZr0.65Ti0.35O3 ferroelectric

2020 ◽  
Vol 53 (4) ◽  
pp. 1039-1050
Author(s):  
Semën Gorfman ◽  
Hyeokmin Choe ◽  
Guanjie Zhang ◽  
Nan Zhang ◽  
Hiroko Yokota ◽  
...  
Keyword(s):  
Data Analysis ◽  
Domain Wall ◽  
Electric Field ◽  
Intensity Distribution ◽  
Wall Motion ◽  
Domain Wall Motion ◽  
Lattice Parameters ◽  
New Method ◽  
Diffraction Intensity ◽  
X Ray

A new data analysis routine is introduced to reconstruct the change in lattice parameters in individual ferroelastic domains and the role of domain-wall motion in the piezoelectric effect. Using special electronics for the synchronization of a PILATUS X-ray area detector with a voltage signal generator, the X-ray diffraction intensity distribution was measured around seven split Bragg peaks as a function of external electric field. The new data analysis algorithm allows the calculation of `extrinsic' (related to domain-wall motion) and `intrinsic' (related to the change in lattice parameters) contributions to the electric-field-induced deformation. Compared with previously existing approaches, the new method benefits from the availability of a three-dimensional diffraction intensity distribution, which enables the separation of Bragg peaks diffracted from differently oriented domain sets. The new technique is applied to calculate the extrinsic and intrinsic contributions to the piezoelectricity in a single crystal of the ferroelectric PbZr1−x Ti x O3 (x = 0.35). The root-mean-square value of the piezoelectric coefficient was obtained as 112 pC N−1. The contribution of the domain-wall motion is estimated as 99 pC N−1. The contribution of electric-field-induced changes to the lattice parameters averaged over all the domains is 71 pC N−1. The equivalent value corresponding to the change in lattice parameters in individual domains may reach up to 189 pC N−1.

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