Improving ultra-fast charging performance and durability of all solid state thin film Li-NMC battery-on-chip systems by in situ TEM lamella analysis

2022 ◽  
Vol 26 ◽  
pp. 101282
Author(s):  
León Romano Brandt ◽  
Kazunori Nishio ◽  
Enrico Salvati ◽  
Kevin P. Simon ◽  
Chrysanthi Papadaki ◽  
...  
Author(s):  
M. Park ◽  
S.J. Krause ◽  
S.R. Wilson

Cu alloying in Al interconnection lines on semiconductor chips improves their resistance to electromigration and hillock growth. Excess Cu in Al can result in the formation of Cu-rich Al2Cu (θ) precipitates. These precipitates can significantly increase corrosion susceptibility due to the galvanic action between the θ-phase and the adjacent Cu-depleted matrix. The size and distribution of the θ-phase are also closely related to the film susceptibility to electromigration voiding. Thus, an important issue is the precipitation phenomena which occur during thermal device processing steps. In bulk alloys, it was found that the θ precipitates can grow via the grain boundary “collector plate mechanism” at rates far greater than allowed by volume diffusion. In a thin film, however, one might expect that the growth rate of a θ precipitate might be altered by interfacial diffusion. In this work, we report on the growth (lengthening) kinetics of the θ-phase in Al-Cu thin films as examined by in-situ isothermal aging in transmission electron microscopy (TEM).


Nano Letters ◽  
2018 ◽  
Vol 18 (9) ◽  
pp. 6064-6070 ◽  
Author(s):  
Jo-Hsuan Ho ◽  
Yi-Hsin Ting ◽  
Jui-Yuan Chen ◽  
Chun-Wei Huang ◽  
Tsung-Chun Tsai ◽  
...  

Author(s):  
Haiming Sun ◽  
Qiunan Liu ◽  
Zhiying Gao ◽  
Lin Geng ◽  
Yanshuai Li ◽  
...  

Single-atom catalysts (SACs) exhibit high catalytic activities in many systems including metal-air batteries. However, the fundamental catalytic mechanism of SACs during charge/discharge process are still unclear. Herein, we report a...


2020 ◽  
Vol 55 (27) ◽  
pp. 12897-12905
Author(s):  
Leonardo Lari ◽  
Stephan Steinhauer ◽  
Vlado K. Lazarov

ACS Nano ◽  
2016 ◽  
Vol 10 (1) ◽  
pp. 1655-1661 ◽  
Author(s):  
Takashi Tsuchiya ◽  
Kazuya Terabe ◽  
Masanori Ochi ◽  
Tohru Higuchi ◽  
Minoru Osada ◽  
...  

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