scholarly journals Fourier analysis of an electrochemical phase formation model enables the rationalization of zinc-anode battery dynamics

2021 ◽  
Vol 5 ◽  
pp. 100033
Author(s):  
Benedetto Bozzini ◽  
Maria Chiara D’Autilia ◽  
Claudio Mele ◽  
Ivonne Sgura
Keyword(s):  
Fourier Analysis ◽  
Phase Formation ◽  
Formation Model ◽  
Zinc Anode ◽  
Anode Battery

Prediction of First Phase Formation at Au-METAL Interfaces Using the Effective Heat of Formation Model

1991 ◽  
Vol 238 ◽  
Author(s):  
R. Pretorius ◽  
T. K. Marais ◽  
A. E. Muller ◽  
D. Knoesen
Keyword(s):  
Phase Formation ◽  
Binary Systems ◽  
Heat Of Formation ◽  
Liquidus Curve ◽  
Effective Concentration ◽  
Formation Model ◽  
Growth Interface ◽  
Effective Heat ◽  
Metal Interfaces ◽  
Effective Heat Of Formation

ABSTRACTThe effective heat of formation model enables heats of formation to be calculated as a function of concentration. By choosing the effective concentration at the growth interface to be that of the liquidus minimum, the model correctly predicL. first phase formation for 14 binary systems for which experimental data was found, except for the Au-Cu system which does not have a well-defined minimum on the liquidus curve.

Simultaneous two-phase formation model in synthesized SBN/NFO using the in-situ modified Pechini method

2019 ◽  
Vol 45 (7) ◽  
pp. 8593-8599
Author(s):  
José Rodrigo M. Hoyos ◽  
Eriton R. Botero ◽  
Ducinei Garcia ◽  
Ruth H.G.A. Kiminami
Keyword(s):  
Phase Formation ◽  
Pechini Method ◽  
Formation Model ◽  
Two Phase ◽  
Modified Pechini Method

Thin-film compound phase formation at Fe–Ge and Cr–Ge interfaces

2003 ◽  
Vol 18 (8) ◽  
pp. 1900-1907 ◽  
Author(s):  
O. M. Ndwandwe ◽  
C. C. Theron ◽  
T. K. Marais ◽  
R. Pretorius
Keyword(s):  
Thin Film ◽  
Phase Formation ◽  
Rutherford Backscattering Spectrometry ◽  
Heat Of Formation ◽  
Miedema Model ◽  
Formation Model ◽  
X Ray Diffraction ◽  
X Ray ◽  
Effective Heat Of Formation ◽  
Transformation Enthalpy

Phase formation was studied in the Fe–Ge and Cr–Ge thin-film systems by means of Rutherford backscattering spectrometry and x-ray diffraction. In the Fe–Ge system, FeGe was the first phase to form while in the Cr–Ge system, Cr11Ge8 was found to form first. The results are compared with the predictions of the effective heat of formation model. Heats of formation were calculated using the Miedema model. The effect of the transformation enthalpy term ΔHtr, used to convert a semiconducting element into a hypothetical metallic one in the Miedema model, is also discussed.

The LDE-Type Flare Occurrence (1969-1993)

1994 ◽  
Vol 144 ◽  
pp. 279-282
Author(s):  
A. Antalová
Keyword(s):  
Time Series ◽  
Fourier Analysis ◽  
Sunspot Cycle ◽  
List Type ◽  
Type Number ◽  
Solar Cycles ◽  
Type Iv ◽  
Long Duration ◽  
Cycle Maximum ◽  
Flare Index

AbstractThe occurrence of LDE-type flares in the last three cycles has been investigated. The Fourier analysis spectrum was calculated for the time series of the LDE-type flare occurrence during the 20-th, the 21-st and the rising part of the 22-nd cycle. LDE-type flares (Long Duration Events in SXR) are associated with the interplanetary protons (SEP and STIP as well), energized coronal archs and radio type IV emission. Generally, in all the cycles considered, LDE-type flares mainly originated during a 6-year interval of the respective cycle (2 years before and 4 years after the sunspot cycle maximum). The following significant periodicities were found:• in the 20-th cycle: 1.4, 2.1, 2.9, 4.0, 10.7 and 54.2 of month,• in the 21-st cycle: 1.2, 1.6, 2.8, 4.9, 7.8 and 44.5 of month,• in the 22-nd cycle, till March 1992: 1.4, 1.8, 2.4, 7.2, 8.7, 11.8 and 29.1 of month,• in all interval (1969-1992):a)the longer periodicities: 232.1, 121.1 (the dominant at 10.1 of year), 80.7, 61.9 and 25.6 of month,b)the shorter periodicities: 4.7, 5.0, 6.8, 7.9, 9.1, 15.8 and 20.4 of month.Fourier analysis of the LDE-type flare index (FI) yields significant peaks at 2.3 - 2.9 months and 4.2 - 4.9 months. These short periodicities correspond remarkably in the all three last solar cycles. The larger periodicities are different in respective cycles.

Characterization of reactive phase formation in sputter-deposited Ni/Al multilayer thin films using TEM

1996 ◽  
Vol 54 ◽  
pp. 1000-1001
Author(s):  
G. Lucadamo ◽  
K. Barmak ◽  
C. Michaelsen
Keyword(s):  
Thin Films ◽  
Phase Formation ◽  
Dark Field ◽  
Nickel Layer ◽  
Multilayer Thin Films ◽  
Cross Sectional ◽  
Dark Field Imaging ◽  
Transmission Electron ◽  
Sputter Deposited ◽  
Constant Heating

The subject of reactive phase formation in multilayer thin films of varying periodicity has stimulated much research over the past few years. Recent studies have sought to understand the reactions that occur during the annealing of Ni/Al multilayers. Dark field imaging from transmission electron microscopy (TEM) studies in conjunction with in situ x-ray diffraction measurements, and calorimetry experiments (isothermal and constant heating rate), have yielded new insights into the sequence of phases that occur during annealing and the evolution of their microstructure.In this paper we report on reactive phase formation in sputter-deposited lNi:3Al multilayer thin films with a periodicity A (the combined thickness of an aluminum and nickel layer) from 2.5 to 320 nm. A cross-sectional TEM micrograph of an as-deposited film with a periodicity of 10 nm is shown in figure 1. This image shows diffraction contrast from the Ni grains and occasionally from the Al grains in their respective layers.

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