Studies of surface resistance of copper(II) phthalocyanine thin films by using a near-field scanning microwave microscope

2004 ◽  
Vol 233 (1-4) ◽  
pp. 213-218 ◽  
Author(s):  
Miehwa Park ◽  
Hyunjun Yoo ◽  
Sunil Yun ◽  
Eunju Lim ◽  
Kiejin Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Resistance ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

Phase transition of copper (II) phthalocyanine thin films characterized by a near-field scanning microwave microscope

2006 ◽  
Vol 499 (1-2) ◽  
pp. 318-321 ◽  
Author(s):  
Miehwa Park ◽  
Hyunjun Yoo ◽  
Hyungun Yoo ◽  
Seungwook Na ◽  
Songhui Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Transition ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

Nondestructive and Non-Contact Characterization Technique for Metal Thin Films Using a Near-Field Microwave Microprobe

2006 ◽  
Vol 321-323 ◽  
pp. 1457-1460 ◽  
Author(s):  
Hyun Jun Yoo ◽  
Jong Chel Kim ◽  
Arsen Babajayan ◽  
Song Hui Kim ◽  
Kie Jin Lee
Keyword(s):  
Thin Films ◽  
Surface Resistance ◽  
Near Field ◽  
Regulation System ◽  
Metallic Thin Films ◽  
Metal Thin Films ◽  
Microwave Characterization ◽  
Distance Regulation ◽  
Near Field Scanning ◽  
Nondestructive Characterization

We observed the surface resistance of metal thin films by a nondestructive characterization method using a near-field scanning microwave microprobe (NSMM). The NSMM system was coupled to a dielectric resonator with a distance regulation system. To demonstrate the ability of local microwave characterization, the surface resistance dependence of the metallic thin films has been mapped nondestructively.

scholarly journals Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope

AIP Advances ◽  
2014 ◽  
Vol 4 (4) ◽  
pp. 047114 ◽  
Author(s):  
Z. Wu ◽  
A. D. Souza ◽  
B. Peng ◽  
W. Q. Sun ◽  
S. Y. Xu ◽  
...  
Keyword(s):  
Thin Film ◽  
High Frequency ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

scholarly journals Surface resistance imaging with a scanning near-field microwave microscope

1997 ◽  
Vol 71 (12) ◽  
pp. 1736-1738 ◽  
Author(s):  
D. E. Steinhauer ◽  
C. P. Vlahacos ◽  
S. K. Dutta ◽  
F. C. Wellstood ◽  
Steven M. Anlage
Keyword(s):  
Surface Resistance ◽  
Near Field ◽  
Microwave Microscope

Investigation of photoconductivity of silicon solar cells by a near-field scanning microwave microscope

2009 ◽  
Vol 109 (8) ◽  
pp. 958-962 ◽  
Author(s):  
Jongchel Kim ◽  
Arsen Babajanyan ◽  
Tigran Sargsyan ◽  
Harutyun Melikyan ◽  
Seungwan Kim ◽  
...  
Keyword(s):  
Solar Cells ◽  
Near Field ◽  
Silicon Solar Cells ◽  
Microwave Microscope ◽  
Near Field Scanning
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