scholarly journals Optical Characterization of Sensory Rhodopsin II Thin Films using a Near-field Scanning Microwave Microscope

2007 ◽  
Vol 20 (1) ◽  
pp. 80-85
Keyword(s):  
Thin Films ◽  
Near Field ◽  
Optical Characterization ◽  
Sensory Rhodopsin ◽  
Microwave Microscope ◽  
Near Field Scanning

Phase transition of copper (II) phthalocyanine thin films characterized by a near-field scanning microwave microscope

2006 ◽  
Vol 499 (1-2) ◽  
pp. 318-321 ◽  
Author(s):  
Miehwa Park ◽  
Hyunjun Yoo ◽  
Hyungun Yoo ◽  
Seungwook Na ◽  
Songhui Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Transition ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics

2012 ◽  
Vol 83 (8) ◽  
pp. 083702 ◽  
Author(s):  
J. C. Weber ◽  
J. B. Schlager ◽  
N. A. Sanford ◽  
A. Imtiaz ◽  
T. M. Wallis ◽  
...  
Keyword(s):  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

Nondestructive characterization of various thin films using a near-field scanning millimeter-wave microscope

2005 ◽  
Vol 275 (1-2) ◽  
pp. e1869-e1873
Author(s):  
Hyunjun Yoo ◽  
Miewha Kim ◽  
Hyun Kim ◽  
Jongil Yang ◽  
Songhui Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Millimeter Wave ◽  
Near Field ◽  
Near Field Scanning ◽  
Nondestructive Characterization

Studies of surface resistance of copper(II) phthalocyanine thin films by using a near-field scanning microwave microscope

2004 ◽  
Vol 233 (1-4) ◽  
pp. 213-218 ◽  
Author(s):  
Miehwa Park ◽  
Hyunjun Yoo ◽  
Sunil Yun ◽  
Eunju Lim ◽  
Kiejin Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Resistance ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning
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