Nondestructive characterization of surface resistance for copper(II) phthalocyanine thin films using a near-field scanning microwave microscope

2005 ◽  
Vol 275 (1-2) ◽  
pp. e1863-e1867
Author(s):  
Miehwa Park ◽  
Hyunjun Yoo ◽  
Eunju Lim ◽  
Jae-yong Kim ◽  
Kiejin Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Resistance ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning ◽  
Nondestructive Characterization

Nondestructive characterization of various thin films using a near-field scanning millimeter-wave microscope

2005 ◽  
Vol 275 (1-2) ◽  
pp. e1869-e1873
Author(s):  
Hyunjun Yoo ◽  
Miewha Kim ◽  
Hyun Kim ◽  
Jongil Yang ◽  
Songhui Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Millimeter Wave ◽  
Near Field ◽  
Near Field Scanning ◽  
Nondestructive Characterization

Studies of surface resistance of copper(II) phthalocyanine thin films by using a near-field scanning microwave microscope

2004 ◽  
Vol 233 (1-4) ◽  
pp. 213-218 ◽  
Author(s):  
Miehwa Park ◽  
Hyunjun Yoo ◽  
Sunil Yun ◽  
Eunju Lim ◽  
Kiejin Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Resistance ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

Nondestructive and Non-Contact Characterization Technique for Metal Thin Films Using a Near-Field Microwave Microprobe

2006 ◽  
Vol 321-323 ◽  
pp. 1457-1460 ◽  
Author(s):  
Hyun Jun Yoo ◽  
Jong Chel Kim ◽  
Arsen Babajayan ◽  
Song Hui Kim ◽  
Kie Jin Lee
Keyword(s):  
Thin Films ◽  
Surface Resistance ◽  
Near Field ◽  
Regulation System ◽  
Metallic Thin Films ◽  
Metal Thin Films ◽  
Microwave Characterization ◽  
Distance Regulation ◽  
Near Field Scanning ◽  
Nondestructive Characterization

We observed the surface resistance of metal thin films by a nondestructive characterization method using a near-field scanning microwave microprobe (NSMM). The NSMM system was coupled to a dielectric resonator with a distance regulation system. To demonstrate the ability of local microwave characterization, the surface resistance dependence of the metallic thin films has been mapped nondestructively.

Phase transition of copper (II) phthalocyanine thin films characterized by a near-field scanning microwave microscope

2006 ◽  
Vol 499 (1-2) ◽  
pp. 318-321 ◽  
Author(s):  
Miehwa Park ◽  
Hyunjun Yoo ◽  
Hyungun Yoo ◽  
Seungwook Na ◽  
Songhui Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Transition ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics

2012 ◽  
Vol 83 (8) ◽  
pp. 083702 ◽  
Author(s):  
J. C. Weber ◽  
J. B. Schlager ◽  
N. A. Sanford ◽  
A. Imtiaz ◽  
T. M. Wallis ◽  
...  
Keyword(s):  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning
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