The effect of C60 cluster ion beam bombardment in sputter depth profiling of organic–inorganic hybrid multiple thin films

2008 ◽  
Vol 255 (4) ◽  
pp. 1055-1057 ◽  
Author(s):  
Hyun Kyong Shon ◽  
Tae Geol Lee ◽  
Dahl Hyun Kim ◽  
Hee Jae Kang ◽  
Byoung Hoon Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Ion Beam ◽  
Depth Profiling ◽  
Inorganic Hybrid ◽  
Cluster Ion

scholarly journals Irradiation effect on magnetic properties of FeRh thin films with energetic C60 cluster ion beam

AIP Advances ◽  
2018 ◽  
Vol 8 (5) ◽  
pp. 056433 ◽  
Author(s):  
Ryunosuke Soma ◽  
Yuichi Saitoh ◽  
Masako Sakamaki ◽  
Kenta Amemiya ◽  
Akihiro Iwase ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Ion Beam ◽  
Irradiation Effect ◽  
Cluster Ion

Molecular depth profiling of trehalose using a C60 cluster ion beam

2008 ◽  
Vol 255 (4) ◽  
pp. 959-961 ◽  
Author(s):  
Andreas Wucher ◽  
Juan Cheng ◽  
Nicholas Winograd
Keyword(s):  
Ion Beam ◽  
Depth Profiling ◽  
Molecular Depth Profiling ◽  
Cluster Ion

XPS depth profiling of an ultrathin bioorganic film with an argon gas cluster ion beam

2016 ◽  
Vol 11 (2) ◽  
pp. 029603 ◽  
Author(s):  
Paul M. Dietrich ◽  
Carolin Nietzold ◽  
Matthias Weise ◽  
Wolfgang E. S. Unger ◽  
Saad Alnabulsi ◽  
...  
Keyword(s):  
Ion Beam ◽  
Depth Profiling ◽  
Argon Gas ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam

X-ray photoelectron spectroscopy study of polyimide thin films with Ar cluster ion depth profiling

2010 ◽  
Vol 28 (2) ◽  
pp. L1-L4 ◽  
Author(s):  
T. Miyayama ◽  
N. Sanada ◽  
M. Suzuki ◽  
J. S. Hammond ◽  
S.-Q. D. Si ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Depth Profiling ◽  
Spectroscopy Study ◽  
X Ray ◽  
Cluster Ion

scholarly journals Applications of Ar Gas Cluster Ion Beam to Oxide Thin Films

2015 ◽  
Vol 22 (2) ◽  
pp. 97-103
Author(s):  
Chanae Park ◽  
Hongchol Chae ◽  
Nam Seok Park ◽  
Hee Jae Kang
Keyword(s):  
Thin Films ◽  
Ion Beam ◽  
Oxide Thin Films ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Ar Gas

X-ray Photoelectron Spectroscopy Study of Diamond-Like Carbon Thin Films Formed by Ar Gas Cluster Ion Beam-Assisted Fullerene Deposition

2008 ◽  
Vol 47 (5) ◽  
pp. 3380-3383 ◽  
Author(s):  
Yuichi Haruyama ◽  
Teruyuki Kitagawa ◽  
Kazuhiro Kanda ◽  
Shinji Matsui ◽  
Tatsuo Gejo ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Ion Beam ◽  
Diamond Like Carbon ◽  
Spectroscopy Study ◽  
X Ray ◽  
Cluster Ion ◽  
Carbon Thin Films ◽  
Gas Cluster Ion Beam ◽  
Ar Gas

scholarly journals SIMS Depth Profiling of Organic Materials with Ar Cluster Ion Beam

2010 ◽  
Vol 35 (4) ◽  
pp. 785-788
Author(s):  
Satoshi Ninomiya ◽  
Kazuya Ichiki ◽  
Hideaki Yamada ◽  
Yoshihiko Nakata ◽  
Toshio Seki ◽  
...  
Keyword(s):  
Organic Materials ◽  
Ion Beam ◽  
Depth Profiling ◽  
Cluster Ion ◽  
Sims Depth Profiling
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