Nanoscale coating on tip geometry by cryogenic focused ion beam deposition

2021 ◽  
pp. 150355
Author(s):  
Shuo Zhang ◽  
Gediminas Gervinskas ◽  
Yang Liu ◽  
Ross K.W. Marceau ◽  
Jing Fu
2012 ◽  
Vol 626 ◽  
pp. 867-877 ◽  
Author(s):  
Q. Humayun ◽  
U. Hashim

Fabrication techniques for Metal-molecule-metal junction electrodes suitable to study electron tunneling through metal junctions are reviewed. The applications of current technologies such as mechanical break junction, electromigration, shadow mask lithography, focused ion beam deposition, chemical and electrochemical plating, electron-beam lithography, in fabricating vacant junction electrodes are briefly described. For biomolecular sensing applications, the size of the junction electrodes must be small enough to allow the biomolecule inserted into the junction space to connect both leads to keep the molecules in a relaxed and undistorted state. A significant advantage of using Metal-molecule-metal junction electrodes devices is that the junction can be characterized with and without the molecule in place. Any electrical artifacts introduced by the electrode fabrication process are more easily deconvoluted from the intrinsic properties of the molecule.


2017 ◽  
Vol 28 (39) ◽  
pp. 395201 ◽  
Author(s):  
Shih-Hsiang Yen ◽  
Yu-Chen Hung ◽  
Ping-Hung Yeh ◽  
Ya-Wen Su ◽  
Chiu-Yen Wang

Materials ◽  
2021 ◽  
Vol 14 (11) ◽  
pp. 3034
Author(s):  
Nicholas T.H. Farr ◽  
Gareth M. Hughes ◽  
Cornelia Rodenburg

It is well known that carbon present in scanning electron microscopes (SEM), Focused ion beam (FIB) systems and FIB-SEMs, causes imaging artefacts and influences the quality of TEM lamellae or structures fabricated in FIB-SEMs. The severity of such effects depends not only on the quantity of carbon present but also on its bonding state. Despite this, the presence of carbon and its bonding state is not regularly monitored in FIB-SEMs. Here we demonstrated that Secondary Electron Hyperspectral Imaging (SEHI) can be implemented in different FIB-SEMs (ThermoFisher Helios G4-CXe PFIB and Helios Nanolab G3 UC) and used to observe carbon built up/removal and bonding changes resulting from electron/ion beam exposure. As well as the ability to monitor, this study also showed the capability of Plasma FIB Xe exposure to remove carbon contamination from the surface of a Ti6246 alloy without the requirement of chemical surface treatments.


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