Applications of High Sensitivity-Low Energy Ion Scattering (HS-LEIS) in heterogeneous catalysis

We have identified elements present in the ionic liquid–vacuum outer atomic surface of 23 ionic liquids using high sensitivity low-energy ion scattering (LEIS), a very surface sensitive technique.

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Calcium fluoride and gold reference by high sensitivity-low energy ion scattering

Surface Science Spectra ◽

10.1116/1.5115065 ◽

2019 ◽

Vol 26 (2) ◽

pp. 024201 ◽

Cited By ~ 2

Author(s):

Tahereh G. Avval ◽

Cody V. Cushman ◽

Philipp Brüner ◽

Thomas Grehl ◽

Hidde H. Brongersma ◽

...

Keyword(s):

Calcium Fluoride ◽

High Sensitivity ◽

Low Energy ◽

Ion Scattering ◽

Low Energy Ion Scattering

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Surface Composition/Organization of Ionic Liquids with Au Nanoparticles Revealed by High-Sensitivity Low-Energy Ion Scattering

Langmuir ◽

10.1021/la403388b ◽

2013 ◽

Vol 29 (46) ◽

pp. 14301-14306 ◽

Cited By ~ 27

Author(s):

Alan Kauling ◽

Günter Ebeling ◽

Jonder Morais ◽

Agílio Pádua ◽

Thomas Grehl ◽

...

Keyword(s):

Ionic Liquids ◽

Au Nanoparticles ◽

Surface Composition ◽

High Sensitivity ◽

Low Energy ◽

Ion Scattering ◽

Low Energy Ion Scattering

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Quantitative analysis of calcium and fluorine by high‐sensitivity low‐energy ion scattering: Calcium fluoride

Surface and Interface Analysis ◽

10.1002/sia.6889 ◽

2020 ◽

Vol 52 (12) ◽

pp. 1000-1003

Author(s):

Stanislav Průša ◽

Pavel Bábík ◽

Tomáš Šikola ◽

Hidde H. Brongersma

Keyword(s):

Quantitative Analysis ◽

Calcium Fluoride ◽

High Sensitivity ◽

Low Energy ◽

Ion Scattering ◽

Low Energy Ion Scattering

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In vacuo growth studies of Ru thin films on Si, SiN, and SiO2 by high-sensitivity low energy ion scattering

Journal of Applied Physics ◽

10.1063/1.4960577 ◽

2016 ◽

Vol 120 (6) ◽

pp. 065303 ◽

Cited By ~ 4

Author(s):

R. Coloma Ribera ◽

R. W. E. van de Kruijs ◽

J. M. Sturm ◽

A. E. Yakshin ◽

F. Bijkerk

Keyword(s):

Thin Films ◽

High Sensitivity ◽

Low Energy ◽

Ion Scattering ◽

Growth Studies ◽

Low Energy Ion Scattering

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Surface characterization of ultrathin atomic layer deposited molybdenum oxide films using high-sensitivity low-energy ion scattering

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/6.0001164 ◽

2021 ◽

Vol 39 (6) ◽

pp. 063210

Author(s):

Raivathari M. Singhania ◽

Henry Price ◽

Vaneck Y. Kounga ◽

Benjamin Davis ◽

Philipp Brüner ◽

...

Keyword(s):

Molybdenum Oxide ◽

Surface Characterization ◽

Oxide Films ◽

High Sensitivity ◽

Atomic Layer ◽

Low Energy ◽

Ion Scattering ◽

Low Energy Ion Scattering

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High-sensitivity and high-resolution low-energy ion scattering

Vacuum ◽

10.1016/j.vacuum.2009.11.016 ◽

2010 ◽

Vol 84 (8) ◽

pp. 1005-1007 ◽

Cited By ~ 29

Author(s):

Hidde H. Brongersma ◽

Thomas Grehl ◽

Paul A. van Hal ◽

Niels C.W. Kuijpers ◽

Simon G.J. Mathijssen ◽

...

Keyword(s):

High Resolution ◽

High Sensitivity ◽

Low Energy ◽

Ion Scattering ◽

Low Energy Ion Scattering

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Functionalized Ionic Liquids Sputter Decorated with Pd Nanoparticles

Australian Journal of Chemistry ◽

10.1071/ch18183 ◽

2019 ◽

Vol 72 (2) ◽

pp. 49 ◽

Cited By ~ 1

Author(s):

Muhammad I. Qadir ◽

Alan Kauling ◽

Günter Ebeling ◽

Michael Fartmann ◽

Thomas Grehl ◽

...

Keyword(s):

Ionic Liquids ◽

Palladium Nanoparticles ◽

Surface Composition ◽

Ion Pairs ◽

High Sensitivity ◽

Pd Nanoparticles ◽

Low Energy ◽

Ion Scattering ◽

Sputtering Deposition ◽

Low Energy Ion Scattering

The fabrication of surface clean palladium nanoparticles of 3–4nm was accomplished in imidazolium-based functionalized ionic liquids (ILs) having methoxy, cyano, and thio groups by magnetron sputtering deposition. The size of the NPs was strongly dependent on the surface composition and/or organisation of the ILs. The NP growth apparently occurred preferentially in the bulk of the fluids, whereas nucleation apparently occurred preferentially at the IL surface. Smaller NPs were detected close to the methoxy containing IL surface and were covered by at least one layer of IL ion pairs, as revealed by high-sensitivity low-energy ion scattering (HS-LEIS) measurements.

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