A dual-source nonlinear measurement system oriented to the empirical characterization of low-frequency dispersion in microwave electron devices

2011 ◽  
Vol 33 (2) ◽  
pp. 165-175 ◽  
Author(s):  
Antonio Raffo ◽  
Valeria Vadalà ◽  
Pier Andrea Traverso ◽  
Alberto Santarelli ◽  
Giorgio Vannini ◽  
...  
Keyword(s):  
Measurement System ◽  
Low Frequency ◽  
Frequency Dispersion ◽  
Dual Source ◽  
Electron Devices

Characterization of GaN HEMT Low-Frequency Dispersion Through a Multiharmonic Measurement System

2010 ◽  
Vol 58 (9) ◽  
pp. 2490-2496 ◽  
Author(s):  
Antonio Raffo ◽  
Sergio Di Falco ◽  
Valeria Vadala ◽  
Giorgio Vannini
Keyword(s):  
Measurement System ◽  
Low Frequency ◽  
Frequency Dispersion ◽  
Gan Hemt

Complex Dielectric Spectroscopy Characterization of a Li0.982Ta1.004O3 Ferroelectric Single Crystal

1997 ◽  
Vol 500 ◽  
Author(s):  
Ming Dong ◽  
Rosario A. Gerhardt
Keyword(s):  
Dielectric Properties ◽  
Single Crystal ◽  
Measurement Data ◽  
Low Frequency ◽  
Frequency Dispersion ◽  
Nonlinear Least Squares ◽  
Electrical Measurement ◽  
Ferroelectric Single Crystal ◽  
Crystal Bulk

ABSTRACTThe dielectric properties of a c-oriented ferroelectric Li0.982Ta1.004O3 single crystal have been investigated. The frequency and the temperature dependence of the dielectric properties have been measured from 500 to 650°C at frequencies ranging from 5 to 106 Hz. Both blocking and non-blocking electrodes were used for separating the electrode effect from the crystal bulk dielectric response. A low-frequency dispersion was identified to be due to the contribution of Li+ ionic carriers. Based on the electrical measurement data and complex nonlinear least squares fitting, an equivalent circuit is proposed to represent the dielectric properties of the single crystal.

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