Direct comparison of photoemission spectroscopy and in situ Kelvin probe work function measurements on indium tin oxide films

2006 ◽  
Vol 152 (1-2) ◽  
pp. 12-17 ◽  
Author(s):  
M.M. Beerbom ◽  
B. Lägel ◽  
A.J. Cascio ◽  
B.V. Doran ◽  
R. Schlaf
Vacuum ◽  
2014 ◽  
Vol 101 ◽  
pp. 18-21 ◽  
Author(s):  
Shahzada Qamar Hussain ◽  
Woong-Kyo Oh ◽  
ShiHyun Ahn ◽  
Anh Huy Tuan Le ◽  
Sunbo Kim ◽  
...  

1993 ◽  
Vol 334 ◽  
Author(s):  
J.P. Zheng ◽  
H.S. Kwok

AbstractThe electrical and optical properties of room temperature laser deposited indium tin oxide films were studied. It was found that the resistivity of the film was quite sensitive to the deposition conditions. At the optimized conditions, films with a bulk resistivity value of 2.8×10−4 Ω-cm and optical transmission of greater than 90% could be obtained. By using an in situ resistance measurement, it was shown that the initial growth mode was via island formation. Additionally, a classic transition from two- to three-dimensional behavior for the resistance was observed.


2022 ◽  
Vol 741 ◽  
pp. 139035
Author(s):  
T. Chommaux ◽  
P.O. Renault ◽  
D. Thiaudière ◽  
P. Godard ◽  
F. Paumier ◽  
...  

2006 ◽  
Vol 496 (1) ◽  
pp. 75-80 ◽  
Author(s):  
Takayuki Uchida ◽  
Toshifumi Mimura ◽  
Masao Ohtsuka ◽  
Toshio Otomo ◽  
Mieko Ide ◽  
...  

2018 ◽  
Vol 7 (3) ◽  
pp. P87-P90 ◽  
Author(s):  
Shraddha D. Nehate ◽  
Adithya Prakash ◽  
Prabhu Doss Mani ◽  
Kalpathy B. Sundaram

1989 ◽  
Author(s):  
Paul G. Snyder ◽  
Bhola N. De ◽  
John A. .. WoolIam ◽  
T. J. Coutts ◽  
X. Li

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