Analytical and numerical parameter extraction for compact modeling of thermoelectric coolers

Author(s):  
Min Chen ◽  
G. Jeffrey Snyder
2013 ◽  
Vol 61 (16) ◽  
pp. 12-20 ◽  
Author(s):  
Ahmed Shaker ◽  
Gihan T. Sayah ◽  
Mohamed Abouelatta ◽  
Abdelhalim Zekry

2012 ◽  
Vol 2012 ◽  
pp. 1-11 ◽  
Author(s):  
Danqiong Hou ◽  
Griff L. Bilbro ◽  
Robert J. Trew

We have developed a new, zone-based compact physics-based AlGaN/GaN heterojunction field-effect transistor (HFET) model suitable for use in commercial harmonic-balance microwave circuit simulators. The new model is programmed in Verilog-A, an industry-standard compact modeling language. The new model permits the dc, small-signal, and large-signal RF performance for the transistor to be determined as a function of the device geometric structure and design features, material composition parameters, and dc and RF operating conditions. The new physics-based HFET model does not require extensive parameter extraction to determine model element values, as commonly employed for traditional equivalent-circuit-based transistor models. The new model has been calibrated and verified. We report very good agreement between simulated and measured dc and RF performance of an experimental C-band microwave power amplifier.


Mathematics ◽  
2021 ◽  
Vol 9 (17) ◽  
pp. 2159
Author(s):  
María José Ibáñez ◽  
Domingo Barrera ◽  
David Maldonado ◽  
Rafael Yáñez ◽  
Juan Bautista Roldán

An advanced new methodology is presented to improve parameter extraction in resistive memories. The series resistance and some other parameters in resistive memories are obtained, making use of a two-stage algorithm, where the second one is based on quasi-interpolation on non-uniform partitions. The use of this latter advanced mathematical technique provides a numerically robust procedure, and in this manuscript, we focus on it. The series resistance, an essential parameter to characterize the circuit operation of resistive memories, is extracted from experimental curves measured in devices based on hafnium oxide as their dielectric layer. The experimental curves are highly non-linear, due to the underlying physics controlling the device operation, so that a stable numerical procedure is needed. The results also allow promising expectations in the massive extraction of new parameters that can help in the characterization of the electrical device behavior.


2020 ◽  
Vol 8 ◽  
pp. 407-412
Author(s):  
Wondwosen E. Muhea ◽  
Gerard U. Castillo ◽  
Harold C. Ordonez ◽  
Thomas Gneiting ◽  
Gerard Ghibaudo ◽  
...  

2020 ◽  
Vol 67 (12) ◽  
pp. 5685-5692
Author(s):  
Harold Cortes-Ordonez ◽  
C. Haddad ◽  
Xavier Mescot ◽  
Krunoslav Romanjek ◽  
Gerard Ghibaudo ◽  
...  

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