Measuring phase retardation of wave plate based on normalized polarization modulation and error analysis

Optik ◽  
2018 ◽  
Vol 157 ◽  
pp. 798-803
Author(s):  
Jing Liu ◽  
Kai You ◽  
Qiuling Zhao ◽  
Xia Wang
Keyword(s):  
Error Analysis ◽  
Polarization Modulation ◽  
Phase Retardation ◽  
Wave Plate

Improvement of Phase Retardation of Wave Plate with Subwavelength Structures by Heat Treatment

2005 ◽  
Vol 44 (7A) ◽  
pp. 4984-4988 ◽  
Author(s):  
Taisuke Isano ◽  
Yasushi Kaneda ◽  
Takayuki Kadoshima ◽  
Emi Ukaji ◽  
Masahide Sato ◽  
...  
Keyword(s):  
Heat Treatment ◽  
Subwavelength Structures ◽  
Phase Retardation ◽  
Wave Plate

Measuring Phase Retardation and Fast Axis Azimuth of a Wave Plate Using Michelson Interferometer

2008 ◽  
Vol 35 (2) ◽  
pp. 249-253 ◽  
Author(s):  
任洪亮 Ren Hongliang ◽  
王久扬 Wang Jiuyang ◽  
楼立人 Lou Liren ◽  
郑虹 Zheng Hong ◽  
李银妹 Li Yinmei
Keyword(s):  
Michelson Interferometer ◽  
Phase Retardation ◽  
Wave Plate ◽  
Fast Axis

Measure the Phase Retardation and Birefringence of the Mica Wave Plate Using the Spectroscopic Ellipsometer

2010 ◽  
Vol 39 (11) ◽  
pp. 2025-2030
Author(s):  
张旭 ZHANG Xu ◽  
吴福全 WU Fuquan ◽  
张霞 ZHANG Xia ◽  
郝殿中 HAO Dianzhong ◽  
亓丽梅 QI Limei
Keyword(s):  
Phase Retardation ◽  
Wave Plate ◽  
Spectroscopic Ellipsometer

Photoelastic-modulator-based differential frequency polarization modulation measurement and error analysis

2013 ◽  
Vol 21 (4) ◽  
pp. 876-883 ◽  
Author(s):  
王志斌 WANG Zhi-bin ◽  
张瑞 ZHANG Rui ◽  
赵冬娥 ZHAO Dong-e ◽  
陈友华 CHEN You-hua ◽  
魏海潮 WEI Hai-chao
Keyword(s):  
Error Analysis ◽  
Polarization Modulation ◽  
Photoelastic Modulator

Polarization Modulation Fourier Transform Infrared Ellipsometry of Thin Polymer Films

1986 ◽  
Vol 40 (4) ◽  
pp. 498-503 ◽  
Author(s):  
R. T. Graf ◽  
F. Eng ◽  
J. L. Koenig ◽  
H. Ishida
Keyword(s):  
Optical Constants ◽  
Relative Phase ◽  
Polarization Modulation ◽  
Thin Polymer Films ◽  
Phase Retardation ◽  
Photoelastic Modulator ◽  
Infrared Ellipsometry ◽  
Thin Polymer ◽  
Gold Substrates ◽  
Ft Ir

Polarization modulation infrared ellipsometric spectra were collected on an FT-IR spectrometer, with the use of two linear polarizers and a photoelastic modulator. Samples consisted of thin poly(vinyl acetate) and poly(methyl methacrylate) films on gold substrates. The relative phase retardation (delta) and relative amplitude (psi) were derived from these measurements. These spectra were superior to those from static infrared ellipsometry measurements on the same samples. The thickness and optical constants of the films were calculated from the ellipsometric measurements and compared with reference optical constant spectra.

Error analysis and Stokes parameter measurement of rotating quarter-wave plate polarimeter

2017 ◽  
Vol 26 (12) ◽  
pp. 124201 ◽  
Author(s):  
Dan-Dan Zhi ◽  
Jian-Jun Li ◽  
Dong-Yang Gao ◽  
Wen-Chao Zhai ◽  
Xiong-Hao Huang ◽  
...  
Keyword(s):  
Error Analysis ◽  
Stokes Parameter ◽  
Parameter Measurement ◽  
Quarter Wave Plate ◽  
Wave Plate ◽  
Quarter Wave

Method for the measurement of phase retardation of any wave plate with high precision

2008 ◽  
Vol 47 (30) ◽  
pp. 5562 ◽  
Author(s):  
Weixin Liu ◽  
Ming Liu ◽  
Shulian Zhang
Keyword(s):  
High Precision ◽  
Phase Retardation ◽  
Wave Plate
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