Microstructure, optical and electrical properties of gallium-doped ZnO films prepared by sol–gel method

2013 ◽  
Vol 572 ◽  
pp. 175-179 ◽  
Author(s):  
Qian Li ◽  
Xifeng Li ◽  
Jianhua Zhang
2004 ◽  
Vol 449-452 ◽  
pp. 1009-1012 ◽  
Author(s):  
Cheng Zhu Lu ◽  
Jung Yohn Cho ◽  
Ho Jung Chang ◽  
Sang Woo Joo ◽  
Yong Sheng Wang

We synthesized ZnO nanocrystal colloids adopting sol-gel method using zinc acetate dehydrate as precursor, and prepared ZnO films on glass substrates by a spin-coating technique. The effect of annealing temperature on the structure, optical and electrical properties has been studied. The crystallinity and morphologies were improved by the annealing. All film samples show high transmittance of above 80% in the wavelength ranging from 400nm to 1000nm. A minimum resistivity of 5.5x10-3 cm was obtained for the film annealed at 500oC. The crystallinity, oxygen vacancies, and nanocrystalline boundaries seems likely to be crucial factors for these properties


2005 ◽  
Vol 12 (05n06) ◽  
pp. 697-701 ◽  
Author(s):  
M. RUSOP ◽  
K. UMA ◽  
T. SOGA ◽  
T. JIMBO

The transparent c-axis oriented ZnO thin films have been prepared by sol–gel method using zinc acetate as cations source, 2-mrthoxiethanol as solvent and monoethanolamine as sol stabilizer. Film deposition was performed by dip coating technique at a withdrawal rate of 10 mm/min on quartz and silicon substrates. The effect of annealing temperature in air ambient from 100 to 800°C on the structural, optical and electrical properties of the films is discussed. ZnO films annealed with higher temperature showed an extremely sharp (002) peak in the XRD patterns, indicates increased crystallization. The optical transmittance spectra of the films is found to change with annealing temperature and showed a very good transmittance (between 80 to 90%) with the films prepared at 600°C showed highest optical transparency within the visible wavelength region. The absorption edge analysis revealed that the optical band gap is found to increase with annealing temperature up to 3.5 eV at 600°C and decreased with higher temperature. Electronic transition was found to be direct transition type. The minimum electrical resistivity of 55 Ω-cm was obtained for the films annealed at 600°C.


2013 ◽  
Vol 652-654 ◽  
pp. 519-522
Author(s):  
Jun Chen ◽  
Yue Hui Hu ◽  
Hong Hao Hu ◽  
Yi Chuan Chen

Transparent thin films of Sn-doped ZnO (ZnO:Sn) were deposited onto silica glass substrates by the sol–gel method. The effect of different Sn doping on the crystallinity, structural, optical and electrical properties of ZnO:Sn thin films were investigated by XRD, SEM, UV-VIS spectrophotometer and four-point probe method respectively. Among all of ZnO:Sn thin films in this paper, Sn-doped with 2 at.% exhibited the best properties, the surface demonstrate an accumulative crystallization and hexagonal structure, with a high-preferential c-axis orientation, namely an average transmittance of 90% and the resistivity of 19.6 Ω·cm.


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