Dependence of Al incorporation on growth temperature during laser molecular beam epitaxy of AlxGa1−xN epitaxial layers on sapphire (0001)

2018 ◽  
Vol 739 ◽  
pp. 122-128 ◽  
Author(s):  
Prashant Tyagi ◽  
Ch Ramesh ◽  
S.S. Kushvaha ◽  
Monu Mishra ◽  
Govind Gupta ◽  
...  
2000 ◽  
Vol 76 (24) ◽  
pp. 3549-3551 ◽  
Author(s):  
T. Makino ◽  
C. H. Chia ◽  
N. T. Tuan ◽  
Y. Segawa ◽  
M. Kawasaki ◽  
...  

1986 ◽  
Vol 4 (4) ◽  
pp. 2086-2090 ◽  
Author(s):  
J. T. Cheung ◽  
G. Niizawa ◽  
J. Moyle ◽  
N. P. Ong ◽  
B. M. Paine ◽  
...  

CrystEngComm ◽  
2019 ◽  
Vol 21 (36) ◽  
pp. 5448-5454 ◽  
Author(s):  
Prashant Tyagi ◽  
Ch. Ramesh ◽  
B. S. Yadav ◽  
S. S. Kushvaha ◽  
M. Senthil Kumar

Self-aligned GaN nanorod assembly directly grown on metal foil substrates is very attractive for developing flexible devices.


2022 ◽  
Vol 355 ◽  
pp. 03047
Author(s):  
Hailong Yu ◽  
Hanchao Gao ◽  
Wei Wang ◽  
Ben Ma ◽  
Zhijun Yin ◽  
...  

InP and InGaAs epitaxial layers on InP substrates using molecular beam epitaxy (MBE) have been studied. Carrier concentration and mobility of InP and InGaAs are found that are strongly correlated with the growth temperature and V/III ratio. The InGaAs layers using As2 were compared with the layers grown using As4 from a Riber standard cracker cell. When As4 is used, the highest electron mobility of InGaAs is 3960 cm2/(V·s) with the V/III ratio of 65. When converted to As2, the V/III ratio with the highest electron mobility decreased to 20. With the arsenic cracker temperature decreased from 950 ℃ to 830 ℃, the electron mobility increased from 4090 cm2/(V • s) to 5060 cm2/(V • s).


2017 ◽  
Vol 66 ◽  
pp. 142-148 ◽  
Author(s):  
Ripudaman Dixit ◽  
Prashant Tyagi ◽  
Sunil Singh Kushvaha ◽  
Sreekumar Chockalingam ◽  
Brajesh Singh Yadav ◽  
...  

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