Erratum: “Exciton spectra of ZnO epitaxial layers on lattice-matched substrates grown with laser-molecular-beam epitaxy” [Appl. Phys. Lett. 76, 3549 (2000)]

2000 ◽  
Vol 77 (9) ◽  
pp. 1405-1405 ◽  
Author(s):  
T. Makino ◽  
C. H. Chia ◽  
N. T. Tuan ◽  
Y. Segawa ◽  
M. Kawasaki ◽  
...  

2000 ◽  
Vol 76 (24) ◽  
pp. 3549-3551 ◽  
Author(s):  
T. Makino ◽  
C. H. Chia ◽  
N. T. Tuan ◽  
Y. Segawa ◽  
M. Kawasaki ◽  
...  


2002 ◽  
Vol 80 (16) ◽  
pp. 2860-2862 ◽  
Author(s):  
S. F. Chichibu ◽  
A. Tsukazaki ◽  
M. Kawasaki ◽  
K. Tamura ◽  
Y. Segawa ◽  
...  


2013 ◽  
Vol 1561 ◽  
Author(s):  
Cheng-Ying Huang ◽  
Jeremy J. M. Law ◽  
Hong Lu ◽  
Mark J. W. Rodwell ◽  
Arthur C. Gossard

ABSTRACTWe investigated AlAs0.56Sb0.44 epitaxial layers lattice-matched to InP grown by molecular beam epitaxy (MBE). Silicon (Si) and tellurium (Te) were studied as n-type dopants in AlAs0.56Sb0.44 material. Similar to most Sb-based materials, AlAs0.56Sb0.44 demonstrates a maximum active carrier concentration around low-1018 cm-3 when using Te as a dopant. We propose the use of a heavily Si-doped InAlAs layer embedded in the AlAsSb barrier as a modulation-doped layer. The In0.53Ga0.47As/AlAs0.56Sb0.44 double heterostructures with a 10 nm InGaAs well show an electron mobility of about 9400 cm2/V・s at 295 K and 32000 cm2/V・s at 46 K. A thinner 5 nm InGaAs well has an electron mobility of about 4300 cm2/V・s at 295 K. This study demonstrates that AlAs0.56Sb0.44 is a promising barrier material for highly scaled InGaAs MOSFETs and HEMTs.



1986 ◽  
Vol 4 (4) ◽  
pp. 2086-2090 ◽  
Author(s):  
J. T. Cheung ◽  
G. Niizawa ◽  
J. Moyle ◽  
N. P. Ong ◽  
B. M. Paine ◽  
...  


1985 ◽  
Vol 56 ◽  
Author(s):  
H. ZOGG ◽  
P. MAIER ◽  
P. NORTON

AbstractGraded (Ca,Ba)F2 layers consisting of near lattice matched CaF2 at the Si interface and of BaF2 with 14% increased lattice constant at the top surface were grown by molecular beam epitaxy (MBE) on Si(111). Smooth and crackfree layers exhibiting Rutherford backscattering (RBS) channeling minima below 5% were obtained. Device quality epitaxial layers of PbTe, PbSe and (Pb,Sn)Se were grown on top of these structures. Mechanical stress at 300K was relaxed by athermal mechanisms in the fluoride- as well as in the Pb-salt films. - In preliminary runs, epitaxial CdTe-layers were obtained on Si(111) using the same fluoride-buffer film technique and which showed clear SEM electron channeling patterns.



2001 ◽  
Vol 78 (18) ◽  
pp. 2664-2666 ◽  
Author(s):  
M. Murakami ◽  
Y. Matsumoto ◽  
K. Nakajima ◽  
T. Makino ◽  
Y. Segawa ◽  
...  


2018 ◽  
Vol 739 ◽  
pp. 122-128 ◽  
Author(s):  
Prashant Tyagi ◽  
Ch Ramesh ◽  
S.S. Kushvaha ◽  
Monu Mishra ◽  
Govind Gupta ◽  
...  


2017 ◽  
Author(s):  
Prashant Tyagi ◽  
Ramesh Ch. ◽  
S. S. Kushvaha ◽  
M. Senthil Kumar


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