Effect of surfactant sucrose ester on physical properties of dairy whipped emulsions in relation to those of O/W interfacial layers

2006 ◽  
Vol 295 (2) ◽  
pp. 495-503 ◽  
Author(s):  
A. Tual ◽  
E. Bourles ◽  
P. Barey ◽  
A. Houdoux ◽  
M. Desprairies ◽  
...  
2021 ◽  
Vol 113 ◽  
pp. 106541
Author(s):  
Di Zeng ◽  
Yongjian Cai ◽  
Tongxun Liu ◽  
Lihua Huang ◽  
Pingli Liu ◽  
...  

2021 ◽  
Author(s):  
Maria Lidia Herrera ◽  
Virginia Borroni ◽  
Ana Carolina Rodriguez Negrette ◽  
Maria Jose Rodriguez Batiller ◽  
Victor Alonso Garcia Londoño ◽  
...  

2019 ◽  
Vol 123 (40) ◽  
pp. 24520-24532
Author(s):  
Bastien Wild ◽  
Damien Daval ◽  
Jean-Sébastien Micha ◽  
Ian C. Bourg ◽  
Claire E. White ◽  
...  

1976 ◽  
Vol 32 ◽  
pp. 365-377 ◽  
Author(s):  
B. Hauck
Keyword(s):  

The Ap stars are numerous - the photometric systems tool It would be very tedious to review in detail all that which is in the literature concerning the photometry of the Ap stars. In my opinion it is necessary to examine the problem of the photometric properties of the Ap stars by considering first of all the possibility of deriving some physical properties for the Ap stars, or of detecting new ones. My talk today is prepared in this spirit. The classification by means of photoelectric photometric systems is at the present time very well established for many systems, such as UBV, uvbyβ, Vilnius, Geneva and DDO systems. Details and methods of classification can be found in Golay (1974) or in the proceedings of the Albany Colloquium edited by Philip and Hayes (1975).


Author(s):  
Frederick A. Murphy ◽  
Alyne K. Harrison ◽  
Sylvia G. Whitfield

The bullet-shaped viruses are currently classified together on the basis of similarities in virion morphology and physical properties. Biologically and ecologically the member viruses are extremely diverse. In searching for further bases for making comparisons of these agents, the nature of host cell infection, both in vivo and in cultured cells, has been explored by thin-section electron microscopy.


Author(s):  
K.P.D. Lagerlof

Although most materials contain more than one phase, and thus are multiphase materials, the definition of composite materials is commonly used to describe those materials containing more than one phase deliberately added to obtain certain desired physical properties. Composite materials are often classified according to their application, i.e. structural composites and electronic composites, but may also be classified according to the type of compounds making up the composite, i.e. metal/ceramic, ceramic/ceramie and metal/semiconductor composites. For structural composites it is also common to refer to the type of structural reinforcement; whisker-reinforced, fiber-reinforced, or particulate reinforced composites [1-4].For all types of composite materials, it is of fundamental importance to understand the relationship between the microstructure and the observed physical properties, and it is therefore vital to properly characterize the microstructure. The interfaces separating the different phases comprising the composite are of particular interest to understand. In structural composites the interface is often the weakest part, where fracture will nucleate, and in electronic composites structural defects at or near the interface will affect the critical electronic properties.


Author(s):  
A.M. Letsoalo ◽  
M.E. Lee ◽  
E.O. de Neijs

Semiconductor devices require metal contacts for efficient collection of electrical charge. The physics of these metal/semiconductor contacts assumes perfect, abrupt and continuous interfaces between the layers. However, in practice these layers are neither continuous nor abrupt due to poor nucleation conditions and the formation of interfacial layers. The effects of layer thickness, deposition rate and substrate stoichiometry have been previously reported. In this work we will compare the effects of a single deposition technique and multiple depositions on the morphology of indium layers grown on (100) CdTe substrates. The electrical characteristics and specific resistivities of the indium contacts were measured, and their relationships with indium layer morphologies were established.Semi-insulating (100) CdTe samples were cut from Bridgman grown single crystal ingots. The surface of the as-cut slices were mechanically polished using 5μm, 3μm, 1μm and 0,25μm diamond abrasive respectively. This was followed by two minutes immersion in a 5% bromine-methanol solution.


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